Decay kinetics of the 4.4 eV photoluminescence associated with the two states of oxygen-deficient-type defect in amorphous SiO2

Hiroyuki Nishikawa, Eiki Watanabe, Daisuke Ito, Yoshimichi Ohki

    Research output: Contribution to journalArticle

    146 Citations (Scopus)

    Abstract

    We present the first observation of 4.4 eV photoluminescence (PL) decay in an oxygen-deficient-type silica excited with ultraviolet and vacuum ultraviolet photons from synchrotron radiation. The lifetime of the 4.4 eV PL is 4.2, 4.3, and 2.1 ns for the 5.0, 6.9, and 7.6 eV excitations, respectively, indicating the presence of multiple decay channels. This can be explained by an energy diagram involving the interconversion between two states of the oxygen-deficient-type defect.

    Original languageEnglish
    Pages (from-to)2101-2104
    Number of pages4
    JournalPhysical Review Letters
    Volume72
    Issue number13
    Publication statusPublished - 1994

    Fingerprint

    photoluminescence
    defects
    kinetics
    decay
    oxygen
    synchrotron radiation
    diagrams
    silicon dioxide
    life (durability)
    vacuum
    photons
    excitation
    energy

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

    Cite this

    Decay kinetics of the 4.4 eV photoluminescence associated with the two states of oxygen-deficient-type defect in amorphous SiO2 . / Nishikawa, Hiroyuki; Watanabe, Eiki; Ito, Daisuke; Ohki, Yoshimichi.

    In: Physical Review Letters, Vol. 72, No. 13, 1994, p. 2101-2104.

    Research output: Contribution to journalArticle

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    AU - Ito, Daisuke

    AU - Ohki, Yoshimichi

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    AB - We present the first observation of 4.4 eV photoluminescence (PL) decay in an oxygen-deficient-type silica excited with ultraviolet and vacuum ultraviolet photons from synchrotron radiation. The lifetime of the 4.4 eV PL is 4.2, 4.3, and 2.1 ns for the 5.0, 6.9, and 7.6 eV excitations, respectively, indicating the presence of multiple decay channels. This can be explained by an energy diagram involving the interconversion between two states of the oxygen-deficient-type defect.

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