Deep dielectric charging characteristics of ring structure irradiated by energetic electrons

Guochang Li, Shengtao Li, Daomin Min, Xiaoquan Zheng, Shengsheng Yang, Daotan Tang, Liang Shi, Chengxuan Zhao

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)


Deep dielectric charging in ring structure irradiated by energetic electrons is one of the major factors causing spacecraft anomalies. In this paper, based on the physical processes of charge deposition, transport and accumulation, we establish a 2-D deep dielectric charging physical model of a ring structure consisting of insulating materials, electrodes and aluminum shield. Deep dielectric charging properties of insulating materials irradiated by electron energy spectra are simulated and analyzed under typical space environment and extreme space environment. Furthermore, the influences of aluminum shield, insulating material properties and thickness on deep dielectric charging are investigated. When the thickness of aluminum shield is larger than 3 mm, the maximum electron-beam density reduces to 10<sup>-10</sup> A/m<sup>2</sup>, which is so low that it can not induce high electric field within materials. Selected polyimide (PI), polytetrafluoroethylene (PTFE) and composite epoxy resin (FR4) as electrical insulating materials, space charge transport, accumulation and electric field in insulating material of the ring structure are analyzed. It is indicated that the maximum electric field obeys the sequence as follows: PTFE> FR4> PI. Finally, it is found that the electric field is obviously enhanced with the increasing thickness of insulating material. This work paves the way towards the mitigation of deep dielectric charging.

Original languageEnglish
Article number7179199
Pages (from-to)2349-2358
Number of pages10
JournalIEEE Transactions on Dielectrics and Electrical Insulation
Issue number4
Publication statusPublished - 2015 Aug 1
Externally publishedYes


  • 2-D electric field simulation
  • Deep dielectric charging
  • Energetic electron radiation
  • Flux model for internal charging

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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