Defect analysis and prediction by applying the multistage software reliability growth model

Jieming Chi, Kiyoshi Honda, Hironori Washizaki, Yoshiaki Fukazawa, Kazuki Munakata, Sumie Morita, Tadahiro Uehara, Rieko Yamamoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

In software development, defects are inevitable. To improve reliability, software reliability growth models are useful to analyze projects. Selecting an expedient model can also help with defect predictions, but the model must be well fitted to all the original data. A particular software reliability growth model may not fit all the data well. To overcome this issue, herein we use multistage modeling to fit defect data. In the multistage model, an evaluation is used to divide the data into several parts. Each part is fitted with its own growth model, and the separate models are recombined. As a case study, projects provided by a Japanese enterprise are analyzed by both traditional software reliability growth models and the multistage model. The multistage model has a better performance for data with a poor fit using a traditional software reliability growth model.

Original languageEnglish
Title of host publicationProceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages7-11
Number of pages5
ISBN (Electronic)9781509066995
DOIs
Publication statusPublished - 2017 May 10
Event8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017 - Tokyo, Japan
Duration: 2017 Mar 13 → …

Other

Other8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017
CountryJapan
CityTokyo
Period17/3/13 → …

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Keywords

  • Growth Model
  • Multistage Models
  • Software Reliability

ASJC Scopus subject areas

  • Software

Cite this

Chi, J., Honda, K., Washizaki, H., Fukazawa, Y., Munakata, K., Morita, S., Uehara, T., & Yamamoto, R. (2017). Defect analysis and prediction by applying the multistage software reliability growth model. In Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017 (pp. 7-11). [7925417] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IWESEP.2017.16