Degradation characteristics of YBCO-coated conductors subjected to overcurrent pulse

Atsushi Ishiyama, Yukiyasu Nishio, Hiroshi Ueda, Naoji Kashima, Masami Mori, Tomonori Watanabe, Shigeo Nagaya, Masashi Yagi, Shinichi Mukoyama, Takato Machi, Yuh Shiohara

    Research output: Contribution to journalArticle

    11 Citations (Scopus)

    Abstract

    YBCO tapes are expected to be used in future high temperature superconducting (HTS) applications because of their good Jc characteristics at high temperatures and in high applied magnetic fields. In applications to electric power devices such as transmission cables, transformers, and fault current limiters, the HTS conductors will be subjected to short-circuit fault currents that are 10 to 30 times the normal operating current. These overcurrents are greater than the critical current, and degrade or burn-out the HTS conductors. Therefore, it is important to clarify the mechanism of the degradation caused by such overcurrent pulses. We carried out preliminary experiments on damage caused by overcurrent pulse drive, focusing on the temperature limitation without suffering degradation for overcurrent pulse operation. A 10-mm-wide YBCO tape was cut into 2-mm-wide sample tapes by a laser beam, and the sample tapes were soldered on silver-deposited 100-μm-thick copper plates. Overcurrent tests were carried out on these sample tapes and Ic degradation was investigated. In addition the contact interface between YBCO and the Ag layer or buffer layer before and after the overcurrent drives has been investigated in order to clarify the correlation between the degradation and delamination of sample tapes.

    Original languageEnglish
    Article number5067186
    Pages (from-to)3483-3486
    Number of pages4
    JournalIEEE Transactions on Applied Superconductivity
    Volume19
    Issue number3
    DOIs
    Publication statusPublished - 2009 Jun

    Fingerprint

    Tapes
    tapes
    conductors
    degradation
    Degradation
    pulses
    Temperature
    Fault current limiters
    Electric fault currents
    Critical currents
    short circuits
    Buffer layers
    electric power
    Silver
    Delamination
    transformers
    Short circuit currents
    cables
    Laser beams
    Copper

    Keywords

    • Degradation
    • Overcurrent pulse
    • Temperature limitation
    • YBCO tape

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Condensed Matter Physics
    • Electronic, Optical and Magnetic Materials

    Cite this

    Degradation characteristics of YBCO-coated conductors subjected to overcurrent pulse. / Ishiyama, Atsushi; Nishio, Yukiyasu; Ueda, Hiroshi; Kashima, Naoji; Mori, Masami; Watanabe, Tomonori; Nagaya, Shigeo; Yagi, Masashi; Mukoyama, Shinichi; Machi, Takato; Shiohara, Yuh.

    In: IEEE Transactions on Applied Superconductivity, Vol. 19, No. 3, 5067186, 06.2009, p. 3483-3486.

    Research output: Contribution to journalArticle

    Ishiyama, A, Nishio, Y, Ueda, H, Kashima, N, Mori, M, Watanabe, T, Nagaya, S, Yagi, M, Mukoyama, S, Machi, T & Shiohara, Y 2009, 'Degradation characteristics of YBCO-coated conductors subjected to overcurrent pulse', IEEE Transactions on Applied Superconductivity, vol. 19, no. 3, 5067186, pp. 3483-3486. https://doi.org/10.1109/TASC.2009.2018734
    Ishiyama, Atsushi ; Nishio, Yukiyasu ; Ueda, Hiroshi ; Kashima, Naoji ; Mori, Masami ; Watanabe, Tomonori ; Nagaya, Shigeo ; Yagi, Masashi ; Mukoyama, Shinichi ; Machi, Takato ; Shiohara, Yuh. / Degradation characteristics of YBCO-coated conductors subjected to overcurrent pulse. In: IEEE Transactions on Applied Superconductivity. 2009 ; Vol. 19, No. 3. pp. 3483-3486.
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