Degradation defection methods for electronic circuits

Hiroshi Inujima^*, Uichi Kichijima

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	96-105
Number of pages	10
Journal	Electrical Engineering in Japan
Volume	110
Issue number	1
DOIs	https://doi.org/10.1002/eej.4391100111
Publication status	Published - 1990
Externally published	Yes

ASJC Scopus subject areas

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