Degradation defection methods for electronic circuits

Hiroshi Inujima, Uichi Kichijima

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)96-105
Number of pages10
JournalElectrical Engineering in Japan
Volume110
Issue number1
DOIs
Publication statusPublished - 1990
Externally publishedYes

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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