Degradation defection methods for electronic circuits

Hiroshi Inujima, Uichi Kichijima

Research output: Contribution to journalArticle

Abstract

As the use of electronics in factory control equipment increases, abnormalities or malfunctions of printed circuit cards may have major deleterious effects on equipment operation. The electronic circuit testing methods now in use involve the analysis of malfunctions after they have occurred. This paper presents a method of degradation diagnosis method which detects the degradation symptoms in the electronic cards earlier and with higher sensitivity than in previous techniques.

Original languageEnglish
Pages (from-to)96-105
Number of pages10
JournalElectrical Engineering in Japan (English translation of Denki Gakkai Ronbunshi)
Volume110
Issue number1
Publication statusPublished - 1990 Aug
Externally publishedYes

Fingerprint

Degradation
Printed circuits
Control equipment
Networks (circuits)
Industrial plants
Electronic equipment
Testing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Degradation defection methods for electronic circuits. / Inujima, Hiroshi; Kichijima, Uichi.

In: Electrical Engineering in Japan (English translation of Denki Gakkai Ronbunshi), Vol. 110, No. 1, 08.1990, p. 96-105.

Research output: Contribution to journalArticle

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