Degradation defection methods for electronic circuits

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A degradation diagnosis method that detects the degradation symptoms of electronic cards earlier and with higher sensitivity than previous techniques is presented. One type of degraded IC is obtained experimentally by applying a low surge voltage. For the case of the op-amps, there exists a quantitative relation between the degradation of the IC predicted from the increasing off-set current and the correlation with output noise. The root-mean-square value of the noise is an effective index of degradation detection. A method based on a measurement of the minimum value of supply voltage necessary to maintain the correct logical operation is effective in detecting degraded TTLs. An automatic instrument for degradation detection of electronic cards is developed, and its effectiveness is verified.

Original languageEnglish
Title of host publicationIECON Proceedings (Industrial Electronics Conference)
Place of PublicationLos Alamitos, CA, United States
PublisherPubl by IEEE
Pages636-641
Number of pages6
Volume1
ISBN (Print)0879426004
Publication statusPublished - 1990
Externally publishedYes
Event16th Annual Conference of IEEE Industrial Electronics Society - IECON'90 - Pacific Grove, CA, USA
Duration: 1990 Nov 271990 Nov 30

Other

Other16th Annual Conference of IEEE Industrial Electronics Society - IECON'90
CityPacific Grove, CA, USA
Period90/11/2790/11/30

Fingerprint

Degradation
Networks (circuits)
Transistor transistor logic circuits
Operational amplifiers
Electric potential

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Inujima, H. (1990). Degradation defection methods for electronic circuits. In IECON Proceedings (Industrial Electronics Conference) (Vol. 1, pp. 636-641). Los Alamitos, CA, United States: Publ by IEEE.

Degradation defection methods for electronic circuits. / Inujima, Hiroshi.

IECON Proceedings (Industrial Electronics Conference). Vol. 1 Los Alamitos, CA, United States : Publ by IEEE, 1990. p. 636-641.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Inujima, H 1990, Degradation defection methods for electronic circuits. in IECON Proceedings (Industrial Electronics Conference). vol. 1, Publ by IEEE, Los Alamitos, CA, United States, pp. 636-641, 16th Annual Conference of IEEE Industrial Electronics Society - IECON'90, Pacific Grove, CA, USA, 90/11/27.
Inujima H. Degradation defection methods for electronic circuits. In IECON Proceedings (Industrial Electronics Conference). Vol. 1. Los Alamitos, CA, United States: Publ by IEEE. 1990. p. 636-641
Inujima, Hiroshi. / Degradation defection methods for electronic circuits. IECON Proceedings (Industrial Electronics Conference). Vol. 1 Los Alamitos, CA, United States : Publ by IEEE, 1990. pp. 636-641
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