Degradation in Mechanical and Dielectric Properties of Silicone Rubber under Severe Aging Conditions

Naoshi Hirai, Takuya Kaneko, Seitaro Ito, Takefumi Minakawa, Yoshimichi Ohki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Silicone rubber (SiR), which meets the specifications of insulators in electric cables for use in nuclear power plants (NPPs), was degraded under various aging conditions. The samples were then examined by measuring mid-infrared absorption, elongation at break (EAB), and complex permittivity. As a result, it has become clear that cross-linked structures with siloxane bonds are formed under all the conditions. This degrades the mechanical properties, but the dielectric loss becomes lower. It has also become clear that measurements of EAB and complex permittivity are useful to monitor the aging status of SiR.

Original languageEnglish
Title of host publication2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages126-129
Number of pages4
ISBN (Electronic)9781728131214
DOIs
Publication statusPublished - 2019 Oct
Event2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019 - Richland, United States
Duration: 2019 Oct 202019 Oct 23

Publication series

NameAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Volume2019-October
ISSN (Print)0084-9162

Conference

Conference2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019
CountryUnited States
CityRichland
Period19/10/2019/10/23

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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  • Cite this

    Hirai, N., Kaneko, T., Ito, S., Minakawa, T., & Ohki, Y. (2019). Degradation in Mechanical and Dielectric Properties of Silicone Rubber under Severe Aging Conditions. In 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019 - Proceedings (pp. 126-129). [9009713] (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP; Vol. 2019-October). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CEIDP47102.2019.9009713