Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method

Keisuke Motoki, Yu Miyazawa, Daisuke Kobayashi, Masashi Ikegami, Tsutomu Miyasaka, Tomoyuki Yamamoto, Kazuyuki Hirose

    Research output: Contribution to journalArticle

    14 Citations (Scopus)

    Abstract

    The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.

    Original languageEnglish
    Article number085501
    JournalJournal of Applied Physics
    Volume121
    Issue number8
    DOIs
    Publication statusPublished - 2017 Feb 28

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    x ray irradiation
    x ray spectroscopy
    photoelectron spectroscopy
    degradation
    valence
    x rays
    iodides
    evaporation
    crystallization
    electronic structure
    temperature

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

    Cite this

    Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method. / Motoki, Keisuke; Miyazawa, Yu; Kobayashi, Daisuke; Ikegami, Masashi; Miyasaka, Tsutomu; Yamamoto, Tomoyuki; Hirose, Kazuyuki.

    In: Journal of Applied Physics, Vol. 121, No. 8, 085501, 28.02.2017.

    Research output: Contribution to journalArticle

    Motoki, Keisuke ; Miyazawa, Yu ; Kobayashi, Daisuke ; Ikegami, Masashi ; Miyasaka, Tsutomu ; Yamamoto, Tomoyuki ; Hirose, Kazuyuki. / Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method. In: Journal of Applied Physics. 2017 ; Vol. 121, No. 8.
    @article{6924783bdd9a4bd0bb56be975afab188,
    title = "Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method",
    abstract = "The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.",
    author = "Keisuke Motoki and Yu Miyazawa and Daisuke Kobayashi and Masashi Ikegami and Tsutomu Miyasaka and Tomoyuki Yamamoto and Kazuyuki Hirose",
    year = "2017",
    month = "2",
    day = "28",
    doi = "10.1063/1.4977238",
    language = "English",
    volume = "121",
    journal = "Journal of Applied Physics",
    issn = "0021-8979",
    publisher = "American Institute of Physics Publising LLC",
    number = "8",

    }

    TY - JOUR

    T1 - Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method

    AU - Motoki, Keisuke

    AU - Miyazawa, Yu

    AU - Kobayashi, Daisuke

    AU - Ikegami, Masashi

    AU - Miyasaka, Tsutomu

    AU - Yamamoto, Tomoyuki

    AU - Hirose, Kazuyuki

    PY - 2017/2/28

    Y1 - 2017/2/28

    N2 - The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.

    AB - The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.

    UR - http://www.scopus.com/inward/record.url?scp=85014025703&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=85014025703&partnerID=8YFLogxK

    U2 - 10.1063/1.4977238

    DO - 10.1063/1.4977238

    M3 - Article

    AN - SCOPUS:85014025703

    VL - 121

    JO - Journal of Applied Physics

    JF - Journal of Applied Physics

    SN - 0021-8979

    IS - 8

    M1 - 085501

    ER -