Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method

Keisuke Motoki, Yu Miyazawa, Daisuke Kobayashi, Masashi Ikegami, Tsutomu Miyasaka, Tomoyuki Yamamoto, Kazuyuki Hirose

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    Abstract

    The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.

    Original languageEnglish
    Article number085501
    JournalJournal of Applied Physics
    Volume121
    Issue number8
    DOIs
    Publication statusPublished - 2017 Feb 28

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    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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