Degradation of YBCO coated conductors caused by over-current pulses

X. Wang, H. Ueda, Atsushi Ishiyama, Y. Iijima, T. Saitoh, N. Kashima, M. Mori, T. Watanabe, S. Nagaya, T. Katoh, T. Machi, Y. Shiohara

    Research output: Contribution to journalArticle

    3 Citations (Scopus)

    Abstract

    YBCO tapes are expected to be used in future high temperature superconductor (HTS) applications because they have excellent Jc characteristics at high temperatures and in high magnetic fields. For application to electric power devices such as transmission cables, transformers, and fault current limiters, the YBCO tapes might be subjected to a short-circuit fault current that is 10-30 times the normal operating current. In a worst-case scenario, YBCO tapes may degrade and burn. Therefore, it is important to clarify the mechanism of the degradation caused by an over-current pulse. This paper describes the experimental results of the degradation of the YBCO tapes through a series of over-current pulse tests. We focussed on the degradation temperature and carried out the experiments with different bending strains. Measurements were performed as a function of the amplitude of an over-current pulse for an operating temperature of 80 K (Gifford-McMahon cryocooler was adopted) in a self-field. We also examined a tape after the experiments with magneto-optical (MO) imaging, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and electron diffraction patterns.

    Original languageEnglish
    Article number012150
    JournalJournal of Physics: Conference Series
    Volume97
    Issue number1
    DOIs
    Publication statusPublished - 2008 Feb 1

    Fingerprint

    conductors
    tapes
    degradation
    pulses
    short circuits
    electric power
    operating temperature
    high temperature superconductors
    transformers
    cables
    diffraction patterns
    electron diffraction
    transmission electron microscopy
    scanning electron microscopy
    magnetic fields
    temperature

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

    Cite this

    Degradation of YBCO coated conductors caused by over-current pulses. / Wang, X.; Ueda, H.; Ishiyama, Atsushi; Iijima, Y.; Saitoh, T.; Kashima, N.; Mori, M.; Watanabe, T.; Nagaya, S.; Katoh, T.; Machi, T.; Shiohara, Y.

    In: Journal of Physics: Conference Series, Vol. 97, No. 1, 012150, 01.02.2008.

    Research output: Contribution to journalArticle

    Wang, X, Ueda, H, Ishiyama, A, Iijima, Y, Saitoh, T, Kashima, N, Mori, M, Watanabe, T, Nagaya, S, Katoh, T, Machi, T & Shiohara, Y 2008, 'Degradation of YBCO coated conductors caused by over-current pulses', Journal of Physics: Conference Series, vol. 97, no. 1, 012150. https://doi.org/10.1088/1742-6596/97/1/012150
    Wang, X. ; Ueda, H. ; Ishiyama, Atsushi ; Iijima, Y. ; Saitoh, T. ; Kashima, N. ; Mori, M. ; Watanabe, T. ; Nagaya, S. ; Katoh, T. ; Machi, T. ; Shiohara, Y. / Degradation of YBCO coated conductors caused by over-current pulses. In: Journal of Physics: Conference Series. 2008 ; Vol. 97, No. 1.
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    AU - Mori, M.

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