Abstract
In order to elucidate the dependence of X-ray photoelectron diffraction (XPED) method on the X-ray source, we investigated XPED patterns from a h-BN/Ni(111) surface by using both Cr-Lα (572.8 eV) and Al-Kα (1486.6 eV). As the first step Ni3p photoelectron diffraction patterns were measured and calculated from a substrate Ni(111) by using both sources. Forward scattering peaks and Kikuchi-like bands were clearly observed in both experimental and theoretical patterns excited by Al-Kα. On the contrary, these features of Cr-Lα excited XPED patterns were more diffuse. This suggests that the usage of a lower energy X-ray source improves XPED structural analysis on ultrathin films composed of light elements.
Original language | English |
---|---|
Pages (from-to) | 859-863 |
Number of pages | 5 |
Journal | Bunseki Kagaku |
Volume | 52 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2003 Oct |
Keywords
- Forward scattering peak
- h-BN/Ni(111)
- Kikuchi-like band
- Multiple scattering cluster with spherical wave
- X-ray photoelectron diffraction
ASJC Scopus subject areas
- Analytical Chemistry