Dependence of photoelectron diffraction of single molecule adsorbing Ni(111) surface on the sources of Cr-Lα and Al-Kα lines

Hitoshi Nakamura, Keiji Tamura, Hideshi Ishii, Masanori Owari, Chuhei Oshima, Yoshimasa Nihei

Research output: Contribution to journalArticle

Abstract

In order to elucidate the dependence of X-ray photoelectron diffraction (XPED) method on the X-ray source, we investigated XPED patterns from a h-BN/Ni(111) surface by using both Cr-Lα (572.8 eV) and Al-Kα (1486.6 eV). As the first step Ni3p photoelectron diffraction patterns were measured and calculated from a substrate Ni(111) by using both sources. Forward scattering peaks and Kikuchi-like bands were clearly observed in both experimental and theoretical patterns excited by Al-Kα. On the contrary, these features of Cr-Lα excited XPED patterns were more diffuse. This suggests that the usage of a lower energy X-ray source improves XPED structural analysis on ultrathin films composed of light elements.

Original languageEnglish
Pages (from-to)859-863
Number of pages5
JournalBunseki Kagaku
Volume52
Issue number10
DOIs
Publication statusPublished - 2003 Oct

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Photoelectrons
Diffraction
X rays
Molecules
Diffraction patterns
Forward scattering
Ultrathin films
Structural analysis
Substrates

Keywords

  • Forward scattering peak
  • h-BN/Ni(111)
  • Kikuchi-like band
  • Multiple scattering cluster with spherical wave
  • X-ray photoelectron diffraction

ASJC Scopus subject areas

  • Analytical Chemistry

Cite this

Dependence of photoelectron diffraction of single molecule adsorbing Ni(111) surface on the sources of Cr-Lα and Al-Kα lines. / Nakamura, Hitoshi; Tamura, Keiji; Ishii, Hideshi; Owari, Masanori; Oshima, Chuhei; Nihei, Yoshimasa.

In: Bunseki Kagaku, Vol. 52, No. 10, 10.2003, p. 859-863.

Research output: Contribution to journalArticle

Nakamura, Hitoshi ; Tamura, Keiji ; Ishii, Hideshi ; Owari, Masanori ; Oshima, Chuhei ; Nihei, Yoshimasa. / Dependence of photoelectron diffraction of single molecule adsorbing Ni(111) surface on the sources of Cr-Lα and Al-Kα lines. In: Bunseki Kagaku. 2003 ; Vol. 52, No. 10. pp. 859-863.
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