Abstract
In order to elucidate the dependence of X-ray photoelectron diffraction (XPED) method on the X-ray source, we investigated XPED patterns from a h-BN/Ni(111) surface by using both Cr-Lα (572.8 eV) and Al-Kα (1486.6 eV). As the first step Ni3p photoelectron diffraction patterns were measured and calculated from a substrate Ni(111) by using both sources. Forward scattering peaks and Kikuchi-like bands were clearly observed in both experimental and theoretical patterns excited by Al-Kα. On the contrary, these features of Cr-Lα excited XPED patterns were more diffuse. This suggests that the usage of a lower energy X-ray source improves XPED structural analysis on ultrathin films composed of light elements.
| Original language | English |
|---|---|
| Pages (from-to) | 859-863 |
| Number of pages | 5 |
| Journal | Bunseki Kagaku |
| Volume | 52 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 2003 Oct |
Fingerprint
Keywords
- Forward scattering peak
- h-BN/Ni(111)
- Kikuchi-like band
- Multiple scattering cluster with spherical wave
- X-ray photoelectron diffraction
ASJC Scopus subject areas
- Analytical Chemistry
Cite this
Dependence of photoelectron diffraction of single molecule adsorbing Ni(111) surface on the sources of Cr-Lα and Al-Kα lines. / Nakamura, Hitoshi; Tamura, Keiji; Ishii, Hideshi; Owari, Masanori; Oshima, Chuhei; Nihei, Yoshimasa.
In: Bunseki Kagaku, Vol. 52, No. 10, 10.2003, p. 859-863.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Dependence of photoelectron diffraction of single molecule adsorbing Ni(111) surface on the sources of Cr-Lα and Al-Kα lines
AU - Nakamura, Hitoshi
AU - Tamura, Keiji
AU - Ishii, Hideshi
AU - Owari, Masanori
AU - Oshima, Chuhei
AU - Nihei, Yoshimasa
PY - 2003/10
Y1 - 2003/10
N2 - In order to elucidate the dependence of X-ray photoelectron diffraction (XPED) method on the X-ray source, we investigated XPED patterns from a h-BN/Ni(111) surface by using both Cr-Lα (572.8 eV) and Al-Kα (1486.6 eV). As the first step Ni3p photoelectron diffraction patterns were measured and calculated from a substrate Ni(111) by using both sources. Forward scattering peaks and Kikuchi-like bands were clearly observed in both experimental and theoretical patterns excited by Al-Kα. On the contrary, these features of Cr-Lα excited XPED patterns were more diffuse. This suggests that the usage of a lower energy X-ray source improves XPED structural analysis on ultrathin films composed of light elements.
AB - In order to elucidate the dependence of X-ray photoelectron diffraction (XPED) method on the X-ray source, we investigated XPED patterns from a h-BN/Ni(111) surface by using both Cr-Lα (572.8 eV) and Al-Kα (1486.6 eV). As the first step Ni3p photoelectron diffraction patterns were measured and calculated from a substrate Ni(111) by using both sources. Forward scattering peaks and Kikuchi-like bands were clearly observed in both experimental and theoretical patterns excited by Al-Kα. On the contrary, these features of Cr-Lα excited XPED patterns were more diffuse. This suggests that the usage of a lower energy X-ray source improves XPED structural analysis on ultrathin films composed of light elements.
KW - Forward scattering peak
KW - h-BN/Ni(111)
KW - Kikuchi-like band
KW - Multiple scattering cluster with spherical wave
KW - X-ray photoelectron diffraction
UR - http://www.scopus.com/inward/record.url?scp=0242656088&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0242656088&partnerID=8YFLogxK
U2 - 10.2116/bunsekikagaku.52.859
DO - 10.2116/bunsekikagaku.52.859
M3 - Article
AN - SCOPUS:0242656088
VL - 52
SP - 859
EP - 863
JO - Bunseki Kagaku
JF - Bunseki Kagaku
SN - 0525-1931
IS - 10
ER -