Depth profile analysis of chemical structures around lubricant/overcoat interface using plasmonic sensor

M. Yanagisawa, M. Kunimoto, T. Homma

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

A chemical depth profile in lubricant films, carbon films, and their interfaces is an informative parameter for hard disk media because molecular features of lubricants bonded to a surface of carbon overcoats (COCs), which usually consist of a nitrogen doped layer, are important to achieve high tribological performance. However, it was difficult to analyze their interfaces with high depth resolution because thickness of lubricant films and COC films are so thin, i.e. 1.5nm and 2nm, respectively. We have developed new method using plasmonic sensors, which has measurement capability for chemical structures with depth resolution of 0.1nm by surface-enhanced Raman spectroscopy (SERS). We examined the lubricant film composed of perfluorinated polyether (PFPE) with phosphazene derivative (A2OH) on a diamond-like carbon (DLC) film. The result shows that the functional group is adsorbed on the DLC surface, where lower shift in the wave number of phenyl group is observed. The depth profile of the intensity ratio of D-peak to G-peak shows the maximum at around the surface of the DLC film. A variety of organic components in the DLC films, fabricated by a chemical vapor deposition (CVD), were observed in it. Besides, the depth profiles shows that organic materials, involving methyl, ethyl, or ethylene groups, Co(OH)x exist in the film.

Original languageEnglish
Title of host publicationASME 2016 Conference on Information Storage and Processing Systems, ISPS 2016
PublisherAmerican Society of Mechanical Engineers
ISBN (Electronic)9780791849880
DOIs
Publication statusPublished - 2016
EventASME 2016 Conference on Information Storage and Processing Systems, ISPS 2016 - Santa Clara, United States
Duration: 2016 Jun 202016 Jun 21

Publication series

NameASME 2016 Conference on Information Storage and Processing Systems, ISPS 2016

Other

OtherASME 2016 Conference on Information Storage and Processing Systems, ISPS 2016
CountryUnited States
CitySanta Clara
Period16/6/2016/6/21

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Hardware and Architecture
  • Information Systems

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