Depth profiling of APTES self-assembled monolayers using surface-enhanced confocal Raman microspectroscopy

Yingying Sun, Masahiro Yanagisawa, Masahiro Kunimoto, Masatoshi Nakamura, Takayuki Homma

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

The internal structure of self-assembled monolayers (SAMs) such as 3-aminopropyltriethoxysilane (APTES) fabricated on a glass substrate is difficult to characterize and analyze at nanometer level. In this study, we employed surface-enhanced Raman spectroscopy (SERS) to study the internal molecular structure of APTES SAMs. The sample APTES SAMs were deposited with Ag nanoparticles to enhance the Raman signal and to obtain subtler structure information, which were supported by density functional theory calculations. In addition, in order to carry out high-resolution analysis, especially for vertical direction, a fine piezo electric positioner was used to control the depth scanning with a step of 0.1 nm. We measured and distinguished the vertical Raman intensity variations of specific groups in APTES, such as Ag/NH2, CH2, and Si[sbnd]O, with high resolution. The interfacial bond at the two interfaces of Ag-APTES and APTES-SiO2 was identified. Moreover, APTES molecule orientation was demonstrated to be inhomogeneous from frequency shift.

Original languageEnglish
Pages (from-to)1-6
Number of pages6
JournalSpectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy
Volume184
DOIs
Publication statusPublished - 2017 Sep 5

Keywords

  • APTES self-assembled monolayers
  • Depth profile
  • Nano resolution
  • Surface-enhanced confocal Raman microspectroscopy

ASJC Scopus subject areas

  • Analytical Chemistry
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Spectroscopy

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