Abstract
For observations of crystalline nanoclusters, the features and capabilities of depth-resolution imaging by aberration-corrected transmission electron microscopy (TEM) were investigated using image simulations and experiments for two types of samples. The first sample was gold clusters attached on an amorphous carbon film. The experimental through-focal series indicated that the focal plane for the cluster was shifted 3nm from that for the supporting film. This difference is due to the depth-resolution imaging of the cluster and film, the mid-planes of which are separated by 3nm along the depth direction (the electron incident direction). On the basis of this information, the three-dimensional configuration of the sample, such as the film thickness of 2nm, was successfully illustrated. The second sample was a Zr66.7Ni33.3 metallic glass including a medium-range-order (MRO) structure, which was approximately considered to be a crystalline cluster with a diameter of 1.6nm. In the experimental through-focal series, the lattice fringe of the MRO cluster was visible at limited focal conditions. Image simulations reproduced well the focal conditions and also indicated a structural condition for the visualization that the embedded cluster must be apart from the mid-plane of the matrix film. Similar to the case of the first sample, this result can be explained by the idea that the "effective focal planes" for the film and cluster are at different heights. This type of depth-resolution phase contrast imaging is possible only in aberration-corrected TEM and when the sample has a simple structure and is sufficiently thin for the kinematical scattering approximation.
| Original language | English |
|---|---|
| Pages (from-to) | 224-231 |
| Number of pages | 8 |
| Journal | Ultramicroscopy |
| Volume | 151 |
| DOIs | |
| Publication status | Published - 2015 Apr 1 |
| Externally published | Yes |
Fingerprint
Keywords
- Aberration-corrected TEM
- Bulk metallic glass
- Depth-resolution imaging
- Gold clusters on a carbon film
- Medium range order
- ZrNi
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation
Cite this
Depth-resolution imaging of crystalline nanoclusters attached on and embedded in amorphous films using aberration-corrected TEM. / Yamasaki, Jun; Mori, Masayuki; Hirata, Akihiko; Hirotsu, Yoshihiko; Tanaka, Nobuo.
In: Ultramicroscopy, Vol. 151, 01.04.2015, p. 224-231.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Depth-resolution imaging of crystalline nanoclusters attached on and embedded in amorphous films using aberration-corrected TEM
AU - Yamasaki, Jun
AU - Mori, Masayuki
AU - Hirata, Akihiko
AU - Hirotsu, Yoshihiko
AU - Tanaka, Nobuo
PY - 2015/4/1
Y1 - 2015/4/1
N2 - For observations of crystalline nanoclusters, the features and capabilities of depth-resolution imaging by aberration-corrected transmission electron microscopy (TEM) were investigated using image simulations and experiments for two types of samples. The first sample was gold clusters attached on an amorphous carbon film. The experimental through-focal series indicated that the focal plane for the cluster was shifted 3nm from that for the supporting film. This difference is due to the depth-resolution imaging of the cluster and film, the mid-planes of which are separated by 3nm along the depth direction (the electron incident direction). On the basis of this information, the three-dimensional configuration of the sample, such as the film thickness of 2nm, was successfully illustrated. The second sample was a Zr66.7Ni33.3 metallic glass including a medium-range-order (MRO) structure, which was approximately considered to be a crystalline cluster with a diameter of 1.6nm. In the experimental through-focal series, the lattice fringe of the MRO cluster was visible at limited focal conditions. Image simulations reproduced well the focal conditions and also indicated a structural condition for the visualization that the embedded cluster must be apart from the mid-plane of the matrix film. Similar to the case of the first sample, this result can be explained by the idea that the "effective focal planes" for the film and cluster are at different heights. This type of depth-resolution phase contrast imaging is possible only in aberration-corrected TEM and when the sample has a simple structure and is sufficiently thin for the kinematical scattering approximation.
AB - For observations of crystalline nanoclusters, the features and capabilities of depth-resolution imaging by aberration-corrected transmission electron microscopy (TEM) were investigated using image simulations and experiments for two types of samples. The first sample was gold clusters attached on an amorphous carbon film. The experimental through-focal series indicated that the focal plane for the cluster was shifted 3nm from that for the supporting film. This difference is due to the depth-resolution imaging of the cluster and film, the mid-planes of which are separated by 3nm along the depth direction (the electron incident direction). On the basis of this information, the three-dimensional configuration of the sample, such as the film thickness of 2nm, was successfully illustrated. The second sample was a Zr66.7Ni33.3 metallic glass including a medium-range-order (MRO) structure, which was approximately considered to be a crystalline cluster with a diameter of 1.6nm. In the experimental through-focal series, the lattice fringe of the MRO cluster was visible at limited focal conditions. Image simulations reproduced well the focal conditions and also indicated a structural condition for the visualization that the embedded cluster must be apart from the mid-plane of the matrix film. Similar to the case of the first sample, this result can be explained by the idea that the "effective focal planes" for the film and cluster are at different heights. This type of depth-resolution phase contrast imaging is possible only in aberration-corrected TEM and when the sample has a simple structure and is sufficiently thin for the kinematical scattering approximation.
KW - Aberration-corrected TEM
KW - Bulk metallic glass
KW - Depth-resolution imaging
KW - Gold clusters on a carbon film
KW - Medium range order
KW - ZrNi
UR - http://www.scopus.com/inward/record.url?scp=84924811926&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84924811926&partnerID=8YFLogxK
U2 - 10.1016/j.ultramic.2014.11.005
DO - 10.1016/j.ultramic.2014.11.005
M3 - Article
AN - SCOPUS:84924811926
VL - 151
SP - 224
EP - 231
JO - Ultramicroscopy
JF - Ultramicroscopy
SN - 0304-3991
ER -