Design for secure test - A case study on pipelined advanced encryption standard

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)

    Abstract

    Cryptography plays an important role in the security of data transmission. To ensure the correctness of crypto hardware, we should conduct testing at fabrication and infield. However, the state-of-the-art scan-based test techniques, to achieve high test qualities, need to increase the testability of the circuit under test, which carries a potential of being misused to reveal the secret information of the crypto hardware. Thus, to develop efficient test strategies for crypto hardware to achieve high test quality without compromising security becomes an important task. In this paper we discuss the development of a Design-forSecure-Test (DFST) technique for pipelined AES to overcome the above contradiction between security and test quality in testing crypto hardware. Unlike previous works, the proposed method can keep all the secrets inside and provide high test quality and fault diagnosis ability as well. Furthermore, the proposed DFST technique can significantly reduce test application time, test data volume, and test generation effort as additional benefits.

    Original languageEnglish
    Title of host publicationProceedings - IEEE International Symposium on Circuits and Systems
    Pages149-152
    Number of pages4
    Publication statusPublished - 2007
    Event2007 IEEE International Symposium on Circuits and Systems, ISCAS 2007 - New Orleans, LA, United States
    Duration: 2007 May 272007 May 30

    Other

    Other2007 IEEE International Symposium on Circuits and Systems, ISCAS 2007
    CountryUnited States
    CityNew Orleans, LA
    Period07/5/2707/5/30

    Fingerprint

    Cryptography
    Hardware
    Testing
    Security of data
    Data communication systems
    Failure analysis
    Fabrication
    Networks (circuits)

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

    Cite this

    Shi, Y., Togawa, N., Yanagisawa, M., & Ohtsuki, T. (2007). Design for secure test - A case study on pipelined advanced encryption standard. In Proceedings - IEEE International Symposium on Circuits and Systems (pp. 149-152). [4252593]

    Design for secure test - A case study on pipelined advanced encryption standard. / Shi, Youhua; Togawa, Nozomu; Yanagisawa, Masao; Ohtsuki, Tatsuo.

    Proceedings - IEEE International Symposium on Circuits and Systems. 2007. p. 149-152 4252593.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Shi, Y, Togawa, N, Yanagisawa, M & Ohtsuki, T 2007, Design for secure test - A case study on pipelined advanced encryption standard. in Proceedings - IEEE International Symposium on Circuits and Systems., 4252593, pp. 149-152, 2007 IEEE International Symposium on Circuits and Systems, ISCAS 2007, New Orleans, LA, United States, 07/5/27.
    Shi Y, Togawa N, Yanagisawa M, Ohtsuki T. Design for secure test - A case study on pipelined advanced encryption standard. In Proceedings - IEEE International Symposium on Circuits and Systems. 2007. p. 149-152. 4252593
    Shi, Youhua ; Togawa, Nozomu ; Yanagisawa, Masao ; Ohtsuki, Tatsuo. / Design for secure test - A case study on pipelined advanced encryption standard. Proceedings - IEEE International Symposium on Circuits and Systems. 2007. pp. 149-152
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