Design-for-secure-test for crypto cores

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    7 Citations (Scopus)

    Abstract

    Scan technology carries the potential of being misused as a "side channel" to leak out the secret information of crypto cores. To address such a design challenge, this paper proposes a design-for-secure-test (DFST) solution for crypto cores by adding a stimuli-launched flip-flop into the traditional scan flip-flop to maintain the high test quality without compromising the security.

    Original languageEnglish
    Title of host publicationProceedings - International Test Conference
    DOIs
    Publication statusPublished - 2009 Dec 15
    EventInternational Test Conference, ITC 2009 - Austin, TX
    Duration: 2009 Nov 12009 Nov 6

    Other

    OtherInternational Test Conference, ITC 2009
    CityAustin, TX
    Period09/11/109/11/6

    Fingerprint

    Flip flop circuits
    Flip
    Design

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Applied Mathematics

    Cite this

    Shi, Y., Togawa, N., Yanagisawa, M., & Ohtsuki, T. (2009). Design-for-secure-test for crypto cores. In Proceedings - International Test Conference [5355900] https://doi.org/10.1109/TEST.2009.5355900

    Design-for-secure-test for crypto cores. / Shi, Youhua; Togawa, Nozomu; Yanagisawa, Masao; Ohtsuki, Tatsuo.

    Proceedings - International Test Conference. 2009. 5355900.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Shi, Y, Togawa, N, Yanagisawa, M & Ohtsuki, T 2009, Design-for-secure-test for crypto cores. in Proceedings - International Test Conference., 5355900, International Test Conference, ITC 2009, Austin, TX, 09/11/1. https://doi.org/10.1109/TEST.2009.5355900
    Shi Y, Togawa N, Yanagisawa M, Ohtsuki T. Design-for-secure-test for crypto cores. In Proceedings - International Test Conference. 2009. 5355900 https://doi.org/10.1109/TEST.2009.5355900
    Shi, Youhua ; Togawa, Nozomu ; Yanagisawa, Masao ; Ohtsuki, Tatsuo. / Design-for-secure-test for crypto cores. Proceedings - International Test Conference. 2009.
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