Detecting facial expressions from face images using a genetic algorithm

Jun Ohya, Fumio Kishino

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

A new method to detect deformations of facial parts from a face image regardless of changes in the position and orientation of a face using the genetic algorithm is proposed. Facial expression parameters that are used to deform and position a 3D face model are assigned to the genes of an individual in a population. The face model is deformed and positioned according to the gene values of each individual and is observed by a virtual camera, and a face image is synthesized. The fitness which evaluates to what extent the real and synthesized face images are similar to each other is calculated. After this process is repeated for sufficient generations, the parameter estimation is obtained from the genes of the individual with the best fitness. Experimental results demonstrate the effectiveness of the method.

Original languageEnglish
Title of host publicationTrack C
Subtitle of host publicationApplications and Robotic Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages649-653
Number of pages5
ISBN (Print)081867282X, 9780818672828
DOIs
Publication statusPublished - 1996 Jan 1
Externally publishedYes
Event13th International Conference on Pattern Recognition, ICPR 1996 - Vienna, Austria
Duration: 1996 Aug 251996 Aug 29

Publication series

NameProceedings - International Conference on Pattern Recognition
Volume3
ISSN (Print)1051-4651

Conference

Conference13th International Conference on Pattern Recognition, ICPR 1996
CountryAustria
CityVienna
Period96/8/2596/8/29

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

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  • Cite this

    Ohya, J., & Kishino, F. (1996). Detecting facial expressions from face images using a genetic algorithm. In Track C: Applications and Robotic Systems (pp. 649-653). [547026] (Proceedings - International Conference on Pattern Recognition; Vol. 3). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICPR.1996.547026