Detecting the Existence of Malfunctions in Microcontrollers Utilizing Power Analysis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Microcontrollers are widely used in electric devices such as smart phones, televisions, and other smart IoT (Internet-of-Things) devices. Because of the increase of these smart IoT devices, the security of hardware devices becomes a serious concern. In this paper, we propose a method which detects the existence of malfunctions implemented in microcontrollers utilizing power analysis. Our method firstly measures power consumption of the target device and classifies its waveform into the sleep-mode part, in which a microcontroller saves power, and the active-mode part, in which a microcontroller works in a normal operation. After that, we focus on the active-mode part and extract several features from the waveform, which effectively distinguish between normal operations and malfunctions. Finally, we classify the features and identify whether malfunctions exist or not. Our experimental results demonstrate that our proposed method successfully detects the existence of malfunctions in our benchmark.

Original languageEnglish
Title of host publication2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, IOLTS 2018
EditorsMihalis Maniatakos, Dan Alexandrescu, Dimitris Gizopoulos, Panagiota Papavramidou
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages97-102
Number of pages6
ISBN (Electronic)9781538659922
DOIs
Publication statusPublished - 2018 Sep 26
Event24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018 - Platja D'Aro, Spain
Duration: 2018 Jul 22018 Jul 4

Publication series

Name2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, IOLTS 2018

Other

Other24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018
Country/TerritorySpain
CityPlatja D'Aro
Period18/7/218/7/4

Keywords

  • hardware security
  • malfunction
  • microcontroller
  • power analysis
  • sleep mode

ASJC Scopus subject areas

  • Hardware and Architecture
  • Software
  • Safety, Risk, Reliability and Quality

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