Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite

Hiroki Asakawa, Masashi Natsui, Yoshimichi Ohki, Toshikatsu Tanaka, Takashi Maeno, Kenji Okamoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In order to study the growth of electrochemical migration along the thickness direction, paper/phenol-resin composite on printed wiring boards was aged at 85 °C and 85%RH by applying of a dc voltage. Then, the sample was observed by a scanning electron microscope with a function of energy dispersive spectroscopy (SEM-EDS) analysis. Space charge distributions in the sample were also measured by the pulsed electroacoustic method. Signals of SEM-EDS showing the presence of Cu were observed on both the anode and cathode. This fact indicates that ionized copper moves toward the cathode inside the composite when an electric field is applied at high temperatures in a highly humid atmosphere.

Original languageEnglish
Title of host publicationProceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
DOIs
Publication statusPublished - 2010 Oct 25
Event2010 IEEE International Conference on Solid Dielectrics, ICSD 2010 - Potsdam, Germany
Duration: 2010 Jul 42010 Jul 9

Publication series

NameProceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010

Other

Other2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
CountryGermany
CityPotsdam
Period10/7/410/7/9

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Keywords

  • Electrochemical migration
  • Paper/phenol-resin composite
  • Printed wiring board
  • Pulsed electroacoustic method
  • SEM-EDS
  • Space charge

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Asakawa, H., Natsui, M., Ohki, Y., Tanaka, T., Maeno, T., & Okamoto, K. (2010). Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite. In Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010 [5568010] (Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010). https://doi.org/10.1109/ICSD.2010.5568010