Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite

Hiroki Asakawa, Masashi Natsui, Yoshimichi Ohki, Toshikatsu Tanaka, Takashi Maeno, Kenji Okamoto

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    In order to study the growth of electrochemical migration along the thickness direction, paper/phenol-resin composite on printed wiring boards was aged at 85 °C and 85%RH by applying of a dc voltage. Then, the sample was observed by a scanning electron microscope with a function of energy dispersive spectroscopy (SEM-EDS) analysis. Space charge distributions in the sample were also measured by the pulsed electroacoustic method. Signals of SEM-EDS showing the presence of Cu were observed on both the anode and cathode. This fact indicates that ionized copper moves toward the cathode inside the composite when an electric field is applied at high temperatures in a highly humid atmosphere.

    Original languageEnglish
    Title of host publicationProceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
    DOIs
    Publication statusPublished - 2010
    Event2010 IEEE International Conference on Solid Dielectrics, ICSD 2010 - Potsdam
    Duration: 2010 Jul 42010 Jul 9

    Other

    Other2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
    CityPotsdam
    Period10/7/410/7/9

    Fingerprint

    Phenols
    Energy dispersive spectroscopy
    Resins
    Composite materials
    Cathodes
    Scanning electron microscopy
    Charge distribution
    Electric space charge
    Printed circuit boards
    Anodes
    Electron microscopes
    Electric fields
    Scanning
    Copper
    Electric potential
    Temperature

    Keywords

    • Electrochemical migration
    • Paper/phenol-resin composite
    • Printed wiring board
    • Pulsed electroacoustic method
    • SEM-EDS
    • Space charge

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

    Cite this

    Asakawa, H., Natsui, M., Ohki, Y., Tanaka, T., Maeno, T., & Okamoto, K. (2010). Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite. In Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010 [5568010] https://doi.org/10.1109/ICSD.2010.5568010

    Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite. / Asakawa, Hiroki; Natsui, Masashi; Ohki, Yoshimichi; Tanaka, Toshikatsu; Maeno, Takashi; Okamoto, Kenji.

    Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010. 2010. 5568010.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Asakawa, H, Natsui, M, Ohki, Y, Tanaka, T, Maeno, T & Okamoto, K 2010, Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite. in Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010., 5568010, 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010, Potsdam, 10/7/4. https://doi.org/10.1109/ICSD.2010.5568010
    Asakawa H, Natsui M, Ohki Y, Tanaka T, Maeno T, Okamoto K. Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite. In Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010. 2010. 5568010 https://doi.org/10.1109/ICSD.2010.5568010
    Asakawa, Hiroki ; Natsui, Masashi ; Ohki, Yoshimichi ; Tanaka, Toshikatsu ; Maeno, Takashi ; Okamoto, Kenji. / Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite. Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010. 2010.
    @inproceedings{71b8b80c2e744b67a6a1b0226aeb7807,
    title = "Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite",
    abstract = "In order to study the growth of electrochemical migration along the thickness direction, paper/phenol-resin composite on printed wiring boards was aged at 85 °C and 85{\%}RH by applying of a dc voltage. Then, the sample was observed by a scanning electron microscope with a function of energy dispersive spectroscopy (SEM-EDS) analysis. Space charge distributions in the sample were also measured by the pulsed electroacoustic method. Signals of SEM-EDS showing the presence of Cu were observed on both the anode and cathode. This fact indicates that ionized copper moves toward the cathode inside the composite when an electric field is applied at high temperatures in a highly humid atmosphere.",
    keywords = "Electrochemical migration, Paper/phenol-resin composite, Printed wiring board, Pulsed electroacoustic method, SEM-EDS, Space charge",
    author = "Hiroki Asakawa and Masashi Natsui and Yoshimichi Ohki and Toshikatsu Tanaka and Takashi Maeno and Kenji Okamoto",
    year = "2010",
    doi = "10.1109/ICSD.2010.5568010",
    language = "English",
    isbn = "9781424479443",
    booktitle = "Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010",

    }

    TY - GEN

    T1 - Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite

    AU - Asakawa, Hiroki

    AU - Natsui, Masashi

    AU - Ohki, Yoshimichi

    AU - Tanaka, Toshikatsu

    AU - Maeno, Takashi

    AU - Okamoto, Kenji

    PY - 2010

    Y1 - 2010

    N2 - In order to study the growth of electrochemical migration along the thickness direction, paper/phenol-resin composite on printed wiring boards was aged at 85 °C and 85%RH by applying of a dc voltage. Then, the sample was observed by a scanning electron microscope with a function of energy dispersive spectroscopy (SEM-EDS) analysis. Space charge distributions in the sample were also measured by the pulsed electroacoustic method. Signals of SEM-EDS showing the presence of Cu were observed on both the anode and cathode. This fact indicates that ionized copper moves toward the cathode inside the composite when an electric field is applied at high temperatures in a highly humid atmosphere.

    AB - In order to study the growth of electrochemical migration along the thickness direction, paper/phenol-resin composite on printed wiring boards was aged at 85 °C and 85%RH by applying of a dc voltage. Then, the sample was observed by a scanning electron microscope with a function of energy dispersive spectroscopy (SEM-EDS) analysis. Space charge distributions in the sample were also measured by the pulsed electroacoustic method. Signals of SEM-EDS showing the presence of Cu were observed on both the anode and cathode. This fact indicates that ionized copper moves toward the cathode inside the composite when an electric field is applied at high temperatures in a highly humid atmosphere.

    KW - Electrochemical migration

    KW - Paper/phenol-resin composite

    KW - Printed wiring board

    KW - Pulsed electroacoustic method

    KW - SEM-EDS

    KW - Space charge

    UR - http://www.scopus.com/inward/record.url?scp=77958064639&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=77958064639&partnerID=8YFLogxK

    U2 - 10.1109/ICSD.2010.5568010

    DO - 10.1109/ICSD.2010.5568010

    M3 - Conference contribution

    AN - SCOPUS:77958064639

    SN - 9781424479443

    BT - Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010

    ER -