Detection of polymer degradation and metal corrosion by terahertz imaging using a quantum cascade laser and a THz camera

Y. Ohki, M. Adachi, M. Komatsu, M. Mizuno, K. Fukunaga

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Recently, THz waves with frequencies from about 0.1 to 10 THz have emerged as a new scientific tool. In this paper, feasibility of locating degraded portions in polymer-insulated power cables by THz waves has been examined, using a compact system consisting of a quantum cascade laser and a THz camera with uncooled microbolometers. The degradation we examined is oxidation of cross-linked polyethylene and rust on copper. As a result, we found that the compact system is capable of detecting polymer oxidation.

Original languageEnglish
Title of host publicationICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics
Pages505-508
Number of pages4
DOIs
Publication statusPublished - 2013 Dec 1
EventICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics - Bologna, Italy
Duration: 2013 Jun 302013 Jul 4

Publication series

NameProceedings of IEEE International Conference on Solid Dielectrics, ICSD
ISSN (Print)1553-5282
ISSN (Electronic)2159-1687

Other

OtherICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics
CountryItaly
CityBologna
Period13/6/3013/7/4

Keywords

  • compact imaging system
  • metal corrosion
  • polymer degradation
  • terahertz imaging

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Condensed Matter Physics

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  • Cite this

    Ohki, Y., Adachi, M., Komatsu, M., Mizuno, M., & Fukunaga, K. (2013). Detection of polymer degradation and metal corrosion by terahertz imaging using a quantum cascade laser and a THz camera. In ICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics (pp. 505-508). [6619816] (Proceedings of IEEE International Conference on Solid Dielectrics, ICSD). https://doi.org/10.1109/ICSD.2013.6619816