Detection of unexpected situations by applying software reliability growth models to test phases

Kiyoshi Honda, Hironori Washizaki, Yoshiaki Fukazawa, Kazuki Munakata, Sumie Morita, Tadahiro Uehara, Rieko Yamamoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

In software development, software reliability growth models (SRGMs) often provide values that do not meet expectations; sometimes the results of the SRGM and the actual data disagree and other times the SRGM overestimates the expected values. The former often occurs in model curves and the predicted number of faults. For example, the software reliability growth curve cannot describe the situation where developers stop testing multiple times because the equations in SRGMs cannot treat such information. The latter can arise when the total number of expected faults is 100, but the SRGM indicates 1000. If developers encounter such situations, they often doubt the SRGM results and hesitate using SRGMs for predictions. In this study, we apply two different cases of SRGM. Two projects of Fujitsu Labs Ltd. are analyzed using SRGM either for the entire dataset or each test phase. Based on the results and interviews with the developers, we found that the model using separate test phases provides a better fit because faults counted in each test phase have different viewpoints and the deviation between SRGM and expectations indicates a problem with development.

Original languageEnglish
Title of host publication2015 IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2-5
Number of pages4
ISBN (Electronic)9781509019441
DOIs
Publication statusPublished - 2016 Jan 25
EventIEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015 - Gaithersburg, United States
Duration: 2015 Nov 22015 Nov 5

Other

OtherIEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015
CountryUnited States
CityGaithersburg
Period15/11/215/11/5

Fingerprint

Software reliability
Software engineering

ASJC Scopus subject areas

  • Software
  • Safety, Risk, Reliability and Quality

Cite this

Honda, K., Washizaki, H., Fukazawa, Y., Munakata, K., Morita, S., Uehara, T., & Yamamoto, R. (2016). Detection of unexpected situations by applying software reliability growth models to test phases. In 2015 IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015 (pp. 2-5). [7392024] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSREW.2015.7392024

Detection of unexpected situations by applying software reliability growth models to test phases. / Honda, Kiyoshi; Washizaki, Hironori; Fukazawa, Yoshiaki; Munakata, Kazuki; Morita, Sumie; Uehara, Tadahiro; Yamamoto, Rieko.

2015 IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015. Institute of Electrical and Electronics Engineers Inc., 2016. p. 2-5 7392024.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Honda, K, Washizaki, H, Fukazawa, Y, Munakata, K, Morita, S, Uehara, T & Yamamoto, R 2016, Detection of unexpected situations by applying software reliability growth models to test phases. in 2015 IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015., 7392024, Institute of Electrical and Electronics Engineers Inc., pp. 2-5, IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015, Gaithersburg, United States, 15/11/2. https://doi.org/10.1109/ISSREW.2015.7392024
Honda K, Washizaki H, Fukazawa Y, Munakata K, Morita S, Uehara T et al. Detection of unexpected situations by applying software reliability growth models to test phases. In 2015 IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015. Institute of Electrical and Electronics Engineers Inc. 2016. p. 2-5. 7392024 https://doi.org/10.1109/ISSREW.2015.7392024
Honda, Kiyoshi ; Washizaki, Hironori ; Fukazawa, Yoshiaki ; Munakata, Kazuki ; Morita, Sumie ; Uehara, Tadahiro ; Yamamoto, Rieko. / Detection of unexpected situations by applying software reliability growth models to test phases. 2015 IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2015. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 2-5
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