Determination of local atomic displacements in CeO1-xFxBiS2 system

E. Paris, B. Joseph, A. Iadecola, T. Sugimoto, L. Olivi, S. Demura, Y. Mizuguchi, Y. Takano, Takashi Mizokawa, N. L. Saini

Research output: Contribution to journalArticle

36 Citations (Scopus)

Abstract

We have used Bi and Ce L 3-edges extended x-ray absorption fine structure measurements to study local structure of CeO1-xFxBiS2 system as a function of F-substitution. The local structure of both BiS2 active layer and CeO1-xFx spacer layer changes systematically. The in-plane Bi-S1 distance decreases (ΔRmax∼0.08) and the out-of-plane Bi-S2 distance increases (ΔRmax∼0.12) with increasing F-content. On the other hand, the Ce-O/F distance increases (ΔRmax∼0.2) with a concomitant decrease of the Ce-S2 distance (ΔRmax∼0.15). Interestingly, the Bi-S1 distance is characterized by a large disorder that increases with F-content. The results provide useful information on the local atomic displacements in CeO1-xFxBiS2, that should be important for the understanding of the coexistence of superconductivity and low temperature ferromagnetism in this system.

Original languageEnglish
Article number435701
JournalJournal of Physics Condensed Matter
Volume26
Issue number43
DOIs
Publication statusPublished - 2014 Oct 29
Externally publishedYes

Fingerprint

Ferromagnetism
Superconductivity
Substitution reactions
X rays
x ray absorption
spacers
ferromagnetism
superconductivity
Temperature
fine structure
disorders
substitutes
temperature

Keywords

  • BiS2 based superconductors
  • coexisting superconductivity and ferromagnetism
  • layered structures
  • nanoscale structure

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Materials Science(all)

Cite this

Paris, E., Joseph, B., Iadecola, A., Sugimoto, T., Olivi, L., Demura, S., ... Saini, N. L. (2014). Determination of local atomic displacements in CeO1-xFxBiS2 system. Journal of Physics Condensed Matter, 26(43), [435701]. https://doi.org/10.1088/0953-8984/26/43/435701

Determination of local atomic displacements in CeO1-xFxBiS2 system. / Paris, E.; Joseph, B.; Iadecola, A.; Sugimoto, T.; Olivi, L.; Demura, S.; Mizuguchi, Y.; Takano, Y.; Mizokawa, Takashi; Saini, N. L.

In: Journal of Physics Condensed Matter, Vol. 26, No. 43, 435701, 29.10.2014.

Research output: Contribution to journalArticle

Paris, E, Joseph, B, Iadecola, A, Sugimoto, T, Olivi, L, Demura, S, Mizuguchi, Y, Takano, Y, Mizokawa, T & Saini, NL 2014, 'Determination of local atomic displacements in CeO1-xFxBiS2 system', Journal of Physics Condensed Matter, vol. 26, no. 43, 435701. https://doi.org/10.1088/0953-8984/26/43/435701
Paris E, Joseph B, Iadecola A, Sugimoto T, Olivi L, Demura S et al. Determination of local atomic displacements in CeO1-xFxBiS2 system. Journal of Physics Condensed Matter. 2014 Oct 29;26(43). 435701. https://doi.org/10.1088/0953-8984/26/43/435701
Paris, E. ; Joseph, B. ; Iadecola, A. ; Sugimoto, T. ; Olivi, L. ; Demura, S. ; Mizuguchi, Y. ; Takano, Y. ; Mizokawa, Takashi ; Saini, N. L. / Determination of local atomic displacements in CeO1-xFxBiS2 system. In: Journal of Physics Condensed Matter. 2014 ; Vol. 26, No. 43.
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