Development of an NDE method using SQUIDs for the reconstruction of defect shapes

Y. Hatsukade, N. Kasai, H. Takashima, R. Kawai, F. Kojima, A. Ishiyama

Research output: Contribution to journalConference article

5 Citations (Scopus)

Abstract

The widespread use of the SQUID-NDE requires the visualization of defects. We have developed a method to obtain depth information by monitoring the SQUID output while changing the frequency of the current flowing in a sample. The effectiveness of this method was verified by experiment and simulation.

Original languageEnglish
Pages (from-to)1311-1314
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume11
Issue number1 I
DOIs
Publication statusPublished - 2001 Mar 1
Event2000 Applied Superconductivity Conference - Virginia Beach, VA, United States
Duration: 2000 Sep 172000 Sep 22

Keywords

  • Depth profile
  • Nondestructive evaluation
  • Reconstruction of defect shape
  • SQUID

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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