Development of helium-microwave-induced plasma-atomic emission spectroscopy system with two-way spectroscopic analysis

Satoshi Ikezawa, Jun Yamamoto, Toshitsugu Ueda

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    This paper reports on a helium-microwave-induced plasma-atomic emission spectroscopy (He-MIP-AES) system with two-way spectroscopic analysis that fulfills the criteria prescribed by the Ministry of Environment, Japan, for measuring the chemical components of particulate matter (PM). The He-MIP-AES system is a reconstruction of a commercial particle analyzer system. In current environmental monitoring systems, PMs are typically collected on trapping filters placed across Japan and classified as either suspended particulate matter (SPM) or PM2.5 depending on the size. The collected PMs are subsequently analyzed with automated measurement instruments such as a piezo balance and with methods such as beta ray attenuation and light scattering. While these measurement methods allow the mass concentration of PMs in the air to be obtained at hourly intervals, the chemical composition of individual particles is analyzed with time-intensive laboratory procedures. In contrast, the presented measurement system allows the chemical compositions and particle sizes to be measured simultaneously in real time.

    Original languageEnglish
    Title of host publicationProceedings of the International Conference on Sensing Technology, ICST
    PublisherIEEE Computer Society
    Pages716-721
    Number of pages6
    Volume2016-March
    ISBN (Print)9781479963140
    DOIs
    Publication statusPublished - 2016 Mar 21
    Event9th International Conference on Sensing Technology, ICST 2015 - Auckland, New Zealand
    Duration: 2015 Dec 82015 Dec 11

    Other

    Other9th International Conference on Sensing Technology, ICST 2015
    CountryNew Zealand
    CityAuckland
    Period15/12/815/12/11

    Fingerprint

    Atomic emission spectroscopy
    Spectroscopic analysis
    Helium
    Microwaves
    Plasmas
    Chemical analysis
    Light scattering
    Particle size
    Monitoring
    Air

    Keywords

    • environmental monitoring
    • micropollutant
    • microwave-induced plasma
    • nanoparticle
    • particulate matter

    ASJC Scopus subject areas

    • Artificial Intelligence
    • Computer Science Applications
    • Signal Processing
    • Electrical and Electronic Engineering

    Cite this

    Ikezawa, S., Yamamoto, J., & Ueda, T. (2016). Development of helium-microwave-induced plasma-atomic emission spectroscopy system with two-way spectroscopic analysis. In Proceedings of the International Conference on Sensing Technology, ICST (Vol. 2016-March, pp. 716-721). [7438490] IEEE Computer Society. https://doi.org/10.1109/ICSensT.2015.7438490

    Development of helium-microwave-induced plasma-atomic emission spectroscopy system with two-way spectroscopic analysis. / Ikezawa, Satoshi; Yamamoto, Jun; Ueda, Toshitsugu.

    Proceedings of the International Conference on Sensing Technology, ICST. Vol. 2016-March IEEE Computer Society, 2016. p. 716-721 7438490.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Ikezawa, S, Yamamoto, J & Ueda, T 2016, Development of helium-microwave-induced plasma-atomic emission spectroscopy system with two-way spectroscopic analysis. in Proceedings of the International Conference on Sensing Technology, ICST. vol. 2016-March, 7438490, IEEE Computer Society, pp. 716-721, 9th International Conference on Sensing Technology, ICST 2015, Auckland, New Zealand, 15/12/8. https://doi.org/10.1109/ICSensT.2015.7438490
    Ikezawa S, Yamamoto J, Ueda T. Development of helium-microwave-induced plasma-atomic emission spectroscopy system with two-way spectroscopic analysis. In Proceedings of the International Conference on Sensing Technology, ICST. Vol. 2016-March. IEEE Computer Society. 2016. p. 716-721. 7438490 https://doi.org/10.1109/ICSensT.2015.7438490
    Ikezawa, Satoshi ; Yamamoto, Jun ; Ueda, Toshitsugu. / Development of helium-microwave-induced plasma-atomic emission spectroscopy system with two-way spectroscopic analysis. Proceedings of the International Conference on Sensing Technology, ICST. Vol. 2016-March IEEE Computer Society, 2016. pp. 716-721
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