Development of the multi-pixel x-ray microcalorimeters

H. Kudo, T. Nakamura, T. Arakawa, S. Ohtsuka, T. Izumi, Shuichi Shoji, H. Sato, H. Kobayashi, K. Mori, Takayuki Homma, Tetsuya Osaka, K. Mitsuda, N. Y. Yamasaki, R. Fujimoto, N. Iyomoto, T. Oshima, K. Futamoto, Y. Takei, T. Ichitsubo, T. FujimoriY. Ishisaki, U. Morita, T. Koga, K. Sato, T. Ohashi, Y. Kuroda, M. Onishi, K. Otake

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

An x-ray microcalorimeter is a promising x-ray spectrometer for its extremely good energy resolution and its good detecting efficiency. We are developing an x-ray microcalorimeter for high energy resolution x-ray imaging application. The energy resolution of 43eV(FWHM) at 5.9keV is obtained with our x-ray microcalorimeter. The intrinsic performance of our x-ray microcalorimeter was estimated to be 10.4eV(FWHM) at 5.9keV. This value is more than 10 times better than that of the conventional x-ray CCD.

Original languageEnglish
Title of host publication2003 Nanotechnology Conference and Trade Show - Nanotech 2003
EditorsM. Laudon, B. Romanowicz
Pages436-439
Number of pages4
Volume1
Publication statusPublished - 2003
Event2003 Nanotechnology Conference and Trade Show - Nanotech 2003 - San Francisco, CA
Duration: 2003 Feb 232003 Feb 27

Other

Other2003 Nanotechnology Conference and Trade Show - Nanotech 2003
CitySan Francisco, CA
Period03/2/2303/2/27

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Keywords

  • Calorimeter
  • Low temperature
  • Spectrometer
  • Temperature sensor
  • X-ray

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Kudo, H., Nakamura, T., Arakawa, T., Ohtsuka, S., Izumi, T., Shoji, S., Sato, H., Kobayashi, H., Mori, K., Homma, T., Osaka, T., Mitsuda, K., Yamasaki, N. Y., Fujimoto, R., Iyomoto, N., Oshima, T., Futamoto, K., Takei, Y., Ichitsubo, T., ... Otake, K. (2003). Development of the multi-pixel x-ray microcalorimeters. In M. Laudon, & B. Romanowicz (Eds.), 2003 Nanotechnology Conference and Trade Show - Nanotech 2003 (Vol. 1, pp. 436-439)