Device Data Application Phase1 on Trusted Data Platform GAIA-X for Decarbonization in Industry

Akio Ito, Akira Sakaino, Shinichiro Chino, Takashi Horikoshi, Mitsushiro Fujishima, Shuichi Ogawa, Tetsuo Takeuchi, Yoshiharu Amano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We started investigation of a proving test equipment development which corresponds to field device tool (FDT®, IEC62453) ver. 3.0 (FDT 3.0) to study theoretically the issues of field device level requirements for industrial smart system design. We select carbon emission data international trade system using European secure data-sharing platform GAIA-X as the target future production system which utilizes FDT3.0. We created a proving test equipment architecture for all automation industry domain including process automation (PA) and factory automation (FA). Manufacturing Execution Systems (MES) study part of the proving test equipment for FA side is constructed and demonstrated at IIFES2022 in collaboration with IAF. We will continue our research to show the use cases which utilizes device data effectively.

Original languageEnglish
Title of host publication2022 61st Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages17-24
Number of pages8
ISBN (Electronic)9784907764784
DOIs
Publication statusPublished - 2022
Event61st Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2022 - Kumamoto, Japan
Duration: 2022 Sep 62022 Sep 9

Publication series

Name2022 61st Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2022

Conference

Conference61st Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2022
Country/TerritoryJapan
CityKumamoto
Period22/9/622/9/9

Keywords

  • Decarbonization
  • Device data
  • FDT3.0
  • GAIA-X
  • Trusted data

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Science Applications
  • Control and Systems Engineering
  • Control and Optimization
  • Instrumentation

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