Diagnostic test generation for transition faults using a stuck-at ATPG TOOL

Yoshinobu Higami; Yosuke Kurose; Satoshi Ohno; Hironori Yamaoka; Hiroshi Takahashi; Yoshihiro Shimizu; Takashi Aikyo; Yuzo Takamatsu

doi:10.1109/TEST.2009.5355681

Diagnostic test generation for transition faults using a stuck-at ATPG TOOL

Yoshinobu Higami^*, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

24 Citations (Scopus)

Abstract

This paper presents a diagnostic test generation method for transition faults. As two consecutive vectors application mechanism, launch on capture test is considered. The proposed algorithm generates test vectors for given fault pairs using a stuck-at ATPG tool so that they are distinguished. If a given fault pair is indistinguishable, it is identified. Therefore the proposed algorithm provides a complete test generation regarding the distinguishability. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic are inserted in a CUT for the test generation. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify all the indistinguishable fault pairs.

Original language	English
Title of host publication	International Test Conference, ITC 2009 - Proceedings
DOIs	https://doi.org/10.1109/TEST.2009.5355681
Publication status	Published - 2009 Dec 15
Externally published	Yes
Event	International Test Conference, ITC 2009 - Austin, TX, United States Duration: 2009 Nov 1 → 2009 Nov 6

Publication series

Name	Proceedings - International Test Conference
ISSN (Print)	1089-3539

Conference

Conference	International Test Conference, ITC 2009
Country/Territory	United States
City	Austin, TX
Period	09/11/1 → 09/11/6

Keywords

Fault diagnosis
Stuck-at ATPG
Test generation
Transition faults

ASJC Scopus subject areas

Electrical and Electronic Engineering
Applied Mathematics

Access to Document

10.1109/TEST.2009.5355681

Cite this

Higami, Y, Kurose, Y, Ohno, S, Yamaoka, H, Takahashi, H, Shimizu, Y, Aikyo, T & Takamatsu, Y 2009, Diagnostic test generation for transition faults using a stuck-at ATPG TOOL. in International Test Conference, ITC 2009 - Proceedings., 5355681, Proceedings - International Test Conference, International Test Conference, ITC 2009, Austin, TX, United States, 09/11/1. https://doi.org/10.1109/TEST.2009.5355681

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title = "Diagnostic test generation for transition faults using a stuck-at ATPG TOOL",

abstract = "This paper presents a diagnostic test generation method for transition faults. As two consecutive vectors application mechanism, launch on capture test is considered. The proposed algorithm generates test vectors for given fault pairs using a stuck-at ATPG tool so that they are distinguished. If a given fault pair is indistinguishable, it is identified. Therefore the proposed algorithm provides a complete test generation regarding the distinguishability. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic are inserted in a CUT for the test generation. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify all the indistinguishable fault pairs.",

keywords = "Fault diagnosis, Stuck-at ATPG, Test generation, Transition faults",

author = "Yoshinobu Higami and Yosuke Kurose and Satoshi Ohno and Hironori Yamaoka and Hiroshi Takahashi and Yoshihiro Shimizu and Takashi Aikyo and Yuzo Takamatsu",

year = "2009",

month = dec,

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doi = "10.1109/TEST.2009.5355681",

language = "English",

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AU - Higami, Yoshinobu

AU - Kurose, Yosuke

AU - Ohno, Satoshi

AU - Yamaoka, Hironori

AU - Takahashi, Hiroshi

AU - Shimizu, Yoshihiro

AU - Aikyo, Takashi

AU - Takamatsu, Yuzo

PY - 2009/12/15

Y1 - 2009/12/15

N2 - This paper presents a diagnostic test generation method for transition faults. As two consecutive vectors application mechanism, launch on capture test is considered. The proposed algorithm generates test vectors for given fault pairs using a stuck-at ATPG tool so that they are distinguished. If a given fault pair is indistinguishable, it is identified. Therefore the proposed algorithm provides a complete test generation regarding the distinguishability. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic are inserted in a CUT for the test generation. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify all the indistinguishable fault pairs.

AB - This paper presents a diagnostic test generation method for transition faults. As two consecutive vectors application mechanism, launch on capture test is considered. The proposed algorithm generates test vectors for given fault pairs using a stuck-at ATPG tool so that they are distinguished. If a given fault pair is indistinguishable, it is identified. Therefore the proposed algorithm provides a complete test generation regarding the distinguishability. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic are inserted in a CUT for the test generation. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify all the indistinguishable fault pairs.

KW - Fault diagnosis

KW - Stuck-at ATPG

KW - Test generation

KW - Transition faults

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Y2 - 1 November 2009 through 6 November 2009

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Diagnostic test generation for transition faults using a stuck-at ATPG TOOL

Abstract

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Conference

Keywords

ASJC Scopus subject areas

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