Diagnostic test generation for transition faults using a stuck-at ATPG TOOL

Yoshinobu Higami*, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

24 Citations (Scopus)


This paper presents a diagnostic test generation method for transition faults. As two consecutive vectors application mechanism, launch on capture test is considered. The proposed algorithm generates test vectors for given fault pairs using a stuck-at ATPG tool so that they are distinguished. If a given fault pair is indistinguishable, it is identified. Therefore the proposed algorithm provides a complete test generation regarding the distinguishability. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic are inserted in a CUT for the test generation. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify all the indistinguishable fault pairs.

Original languageEnglish
Title of host publicationInternational Test Conference, ITC 2009 - Proceedings
Publication statusPublished - 2009 Dec 15
Externally publishedYes
EventInternational Test Conference, ITC 2009 - Austin, TX, United States
Duration: 2009 Nov 12009 Nov 6

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539


ConferenceInternational Test Conference, ITC 2009
Country/TerritoryUnited States
CityAustin, TX


  • Fault diagnosis
  • Stuck-at ATPG
  • Test generation
  • Transition faults

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Applied Mathematics


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