Differential heterodyne optical probe using a Zeeman-laser

Shinichi Komatsu, H. Suhara, H. Ohzu

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    Optical scanning microscopy has been widely used to detect light scattering particles or lattice defects in crystals. On the other hand, optical heterodyne technique using a local heterodyne optical system has been adopted by some authors for aberration free image formation. In this study we developed a light scattering microscope with a differential heterodyne optical system simplified in its configuration by the use of a Zeeman laser, and the feasibility of the system was examined experimentally. Differential heterodyne optical system has the advantage of gaining strong scattered light, simple congiguration, and applicability to the detection of other kinds of physical quantities such as acoustic waves and optically induced electric currents.

    Original languageEnglish
    Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
    PublisherSPIE
    Pages299-300
    Number of pages2
    Volume813
    DOIs
    Publication statusPublished - 1987

    ASJC Scopus subject areas

    • Applied Mathematics
    • Computer Science Applications
    • Electrical and Electronic Engineering
    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics

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  • Cite this

    Komatsu, S., Suhara, H., & Ohzu, H. (1987). Differential heterodyne optical probe using a Zeeman-laser. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 813, pp. 299-300). SPIE. https://doi.org/10.1117/12.967269