Abstract
A digital integration technique based on the use of V/F and D/A converters accompanied by the digital scanning and the synchronous square-wave modulation has been introduced in the scanning Auger electron microscopy. This integrator allows us to perform integration in very high efficiency leading to high signal to noise ratio and to high spatial resolution of the Auger pictures.
| Original language | English |
|---|---|
| Pages (from-to) | 95-97 |
| Number of pages | 3 |
| Journal | Review of Scientific Instruments |
| Volume | 51 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1980 Dec 1 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Instrumentation
Cite this
Digital integrator in scanning Auger electron microscopy. / Goto, K.; Ichimura, Shingo; Shimizu, R.
In: Review of Scientific Instruments, Vol. 51, No. 1, 01.12.1980, p. 95-97.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Digital integrator in scanning Auger electron microscopy
AU - Goto, K.
AU - Ichimura, Shingo
AU - Shimizu, R.
PY - 1980/12/1
Y1 - 1980/12/1
N2 - A digital integration technique based on the use of V/F and D/A converters accompanied by the digital scanning and the synchronous square-wave modulation has been introduced in the scanning Auger electron microscopy. This integrator allows us to perform integration in very high efficiency leading to high signal to noise ratio and to high spatial resolution of the Auger pictures.
AB - A digital integration technique based on the use of V/F and D/A converters accompanied by the digital scanning and the synchronous square-wave modulation has been introduced in the scanning Auger electron microscopy. This integrator allows us to perform integration in very high efficiency leading to high signal to noise ratio and to high spatial resolution of the Auger pictures.
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UR - http://www.scopus.com/inward/citedby.url?scp=0018961501&partnerID=8YFLogxK
U2 - 10.1063/1.1136027
DO - 10.1063/1.1136027
M3 - Article
VL - 51
SP - 95
EP - 97
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
SN - 0034-6748
IS - 1
ER -