Abstract
A digital integration technique based on the use of V/F and D/A converters accompanied by the digital scanning and the synchronous square-wave modulation has been introduced in the scanning Auger electron microscopy. This integrator allows us to perform integration in very high efficiency leading to high signal to noise ratio and to high spatial resolution of the Auger pictures.
Original language | English |
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Pages (from-to) | 95-97 |
Number of pages | 3 |
Journal | Review of Scientific Instruments |
Volume | 51 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1980 |
Externally published | Yes |
ASJC Scopus subject areas
- Instrumentation