Digital integrator in scanning Auger electron microscopy

K. Goto; S. Ichimura; R. Shimizu

doi:10.1063/1.1136027

Digital integrator in scanning Auger electron microscopy

K. Goto, S. Ichimura, R. Shimizu

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Abstract

A digital integration technique based on the use of V/F and D/A converters accompanied by the digital scanning and the synchronous square-wave modulation has been introduced in the scanning Auger electron microscopy. This integrator allows us to perform integration in very high efficiency leading to high signal to noise ratio and to high spatial resolution of the Auger pictures.

Original language	English
Pages (from-to)	95-97
Number of pages	3
Journal	Review of Scientific Instruments
Volume	51
Issue number	1
DOIs	https://doi.org/10.1063/1.1136027
Publication status	Published - 1980 Dec 1

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ASJC Scopus subject areas

Instrumentation

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Goto, K., Ichimura, S., & Shimizu, R. (1980). Digital integrator in scanning Auger electron microscopy. Review of Scientific Instruments, 51(1), 95-97. https://doi.org/10.1063/1.1136027

@article{be44d95716974e01bbfee1fc18b37fbd,

title = "Digital integrator in scanning Auger electron microscopy",

abstract = "A digital integration technique based on the use of V/F and D/A converters accompanied by the digital scanning and the synchronous square-wave modulation has been introduced in the scanning Auger electron microscopy. This integrator allows us to perform integration in very high efficiency leading to high signal to noise ratio and to high spatial resolution of the Auger pictures.",

author = "K. Goto and S. Ichimura and R. Shimizu",

year = "1980",

month = dec

day = "1",

doi = "10.1063/1.1136027",

language = "English",

volume = "51",

pages = "95--97",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

number = "1",

}

TY - JOUR

T1 - Digital integrator in scanning Auger electron microscopy

AU - Goto, K.

AU - Ichimura, S.

AU - Shimizu, R.

PY - 1980/12/1

Y1 - 1980/12/1

N2 - A digital integration technique based on the use of V/F and D/A converters accompanied by the digital scanning and the synchronous square-wave modulation has been introduced in the scanning Auger electron microscopy. This integrator allows us to perform integration in very high efficiency leading to high signal to noise ratio and to high spatial resolution of the Auger pictures.

AB - A digital integration technique based on the use of V/F and D/A converters accompanied by the digital scanning and the synchronous square-wave modulation has been introduced in the scanning Auger electron microscopy. This integrator allows us to perform integration in very high efficiency leading to high signal to noise ratio and to high spatial resolution of the Auger pictures.

UR - http://www.scopus.com/inward/record.url?scp=0018961501&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0018961501&partnerID=8YFLogxK

U2 - 10.1063/1.1136027

DO - 10.1063/1.1136027

M3 - Article

AN - SCOPUS:0018961501

VL - 51

SP - 95

EP - 97

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 1

ER -

Access to Document

10.1063/1.1136027