Direct analysis of the structure, concentration, and chemical activity of surface atomic vacancies by specialized low-energy ion-scattering spectroscopy

TiC(001)

M. Aono, Y. Hou, R. Souda, C. Oshima, S. Otani, Y. Ishizawa

    Research output: Contribution to journalArticle

    98 Citations (Scopus)

    Abstract

    The structure, concentration, and chemical activity of atomic vacancies at the TiC(001) surface have been directly analyzed by specialized low-energy ion-scattering spectroscopy. It has been found that carbon vacancies are formed at the surface under a certain condition, and they capture oxygen atoms into the vacancy holes exhibiting a very high activity.

    Original languageEnglish
    Pages (from-to)1293-1296
    Number of pages4
    JournalPhysical Review Letters
    Volume50
    Issue number17
    DOIs
    Publication statusPublished - 1983

    Fingerprint

    ion scattering
    spectroscopy
    energy
    oxygen atoms
    carbon

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

    Cite this

    Direct analysis of the structure, concentration, and chemical activity of surface atomic vacancies by specialized low-energy ion-scattering spectroscopy : TiC(001). / Aono, M.; Hou, Y.; Souda, R.; Oshima, C.; Otani, S.; Ishizawa, Y.

    In: Physical Review Letters, Vol. 50, No. 17, 1983, p. 1293-1296.

    Research output: Contribution to journalArticle

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    AU - Otani, S.

    AU - Ishizawa, Y.

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