Direct confirmation of the high coherency of the electron beam from a nanotip

Tsuyoshi Ishikawa, Boklae Cho, Eiji Rokuta, Chuhei Oshima

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3 Citations (Scopus)


The coherency of an electron beam from a nanotip was evaluated and compared to that from a tungsten (110) oriented tip by using nano-biprisms in a field-emission projection microscope (FPM). The FPM images were consistent with the corresponding field emission patterns of the employed tip. The nanotip generated much sharper biprism interference patterns than the W(110) tip, and comparison of the visibilities of interference patterns demonstrated directly that a highly coherent electron beam was emitted from the nanotip.

Original languageEnglish
Pages (from-to)770011-770013
Number of pages3
JournalApplied Physics Express
Issue number7
Publication statusPublished - 2008 Jul


ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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