Direct confirmation of the high coherency of the electron beam from a nanotip

Tsuyoshi Ishikawa; Boklae Cho; Eiji Rokuta; Chuhei Oshima

doi:10.1143/APEX.1.077001

Direct confirmation of the high coherency of the electron beam from a nanotip

Tsuyoshi Ishikawa^*, Boklae Cho, Eiji Rokuta, Chuhei Oshima

^*Corresponding author for this work

Waseda University

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

The coherency of an electron beam from a nanotip was evaluated and compared to that from a tungsten (110) oriented tip by using nano-biprisms in a field-emission projection microscope (FPM). The FPM images were consistent with the corresponding field emission patterns of the employed tip. The nanotip generated much sharper biprism interference patterns than the W(110) tip, and comparison of the visibilities of interference patterns demonstrated directly that a highly coherent electron beam was emitted from the nanotip.

Original language	English
Pages (from-to)	770011-770013
Number of pages	3
Journal	Applied Physics Express
Volume	1
Issue number	7
DOIs	https://doi.org/10.1143/APEX.1.077001
Publication status	Published - 2008 Jul

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

Access to Document

10.1143/APEX.1.077001

Cite this

@article{49b06d574b2c40cdaadfe0676f72329e,

title = "Direct confirmation of the high coherency of the electron beam from a nanotip",

abstract = "The coherency of an electron beam from a nanotip was evaluated and compared to that from a tungsten (110) oriented tip by using nano-biprisms in a field-emission projection microscope (FPM). The FPM images were consistent with the corresponding field emission patterns of the employed tip. The nanotip generated much sharper biprism interference patterns than the W(110) tip, and comparison of the visibilities of interference patterns demonstrated directly that a highly coherent electron beam was emitted from the nanotip.",

author = "Tsuyoshi Ishikawa and Boklae Cho and Eiji Rokuta and Chuhei Oshima",

year = "2008",

month = jul,

doi = "10.1143/APEX.1.077001",

language = "English",

volume = "1",

pages = "770011--770013",

journal = "Applied Physics Express",

issn = "1882-0778",

publisher = "Japan Society of Applied Physics",

number = "7",

}

TY - JOUR

T1 - Direct confirmation of the high coherency of the electron beam from a nanotip

AU - Ishikawa, Tsuyoshi

AU - Cho, Boklae

AU - Rokuta, Eiji

AU - Oshima, Chuhei

PY - 2008/7

Y1 - 2008/7

N2 - The coherency of an electron beam from a nanotip was evaluated and compared to that from a tungsten (110) oriented tip by using nano-biprisms in a field-emission projection microscope (FPM). The FPM images were consistent with the corresponding field emission patterns of the employed tip. The nanotip generated much sharper biprism interference patterns than the W(110) tip, and comparison of the visibilities of interference patterns demonstrated directly that a highly coherent electron beam was emitted from the nanotip.

AB - The coherency of an electron beam from a nanotip was evaluated and compared to that from a tungsten (110) oriented tip by using nano-biprisms in a field-emission projection microscope (FPM). The FPM images were consistent with the corresponding field emission patterns of the employed tip. The nanotip generated much sharper biprism interference patterns than the W(110) tip, and comparison of the visibilities of interference patterns demonstrated directly that a highly coherent electron beam was emitted from the nanotip.

UR - http://www.scopus.com/inward/record.url?scp=57649083545&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=57649083545&partnerID=8YFLogxK

U2 - 10.1143/APEX.1.077001

DO - 10.1143/APEX.1.077001

M3 - Article

AN - SCOPUS:57649083545

SN - 1882-0778

VL - 1

SP - 770011

EP - 770013

JO - Applied Physics Express

JF - Applied Physics Express

IS - 7

ER -

Direct confirmation of the high coherency of the electron beam from a nanotip

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this