Direct confirmation of the high coherency of the electron beam from a nanotip

Tsuyoshi Ishikawa, Boklae Cho, Eiji Rokuta, Chuhei Oshima

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The coherency of an electron beam from a nanotip was evaluated and compared to that from a tungsten (110) oriented tip by using nano-biprisms in a field-emission projection microscope (FPM). The FPM images were consistent with the corresponding field emission patterns of the employed tip. The nanotip generated much sharper biprism interference patterns than the W(110) tip, and comparison of the visibilities of interference patterns demonstrated directly that a highly coherent electron beam was emitted from the nanotip.

Original languageEnglish
Pages (from-to)770011-770013
Number of pages3
JournalApplied Physics Express
Volume1
Issue number7
DOIs
Publication statusPublished - 2008 Jul

Fingerprint

Nanotips
Field emission
field emission
Electron beams
electron beams
Microscopes
projection
microscopes
interference
visibility
Visibility
Tungsten
tungsten

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Direct confirmation of the high coherency of the electron beam from a nanotip. / Ishikawa, Tsuyoshi; Cho, Boklae; Rokuta, Eiji; Oshima, Chuhei.

In: Applied Physics Express, Vol. 1, No. 7, 07.2008, p. 770011-770013.

Research output: Contribution to journalArticle

Ishikawa, Tsuyoshi ; Cho, Boklae ; Rokuta, Eiji ; Oshima, Chuhei. / Direct confirmation of the high coherency of the electron beam from a nanotip. In: Applied Physics Express. 2008 ; Vol. 1, No. 7. pp. 770011-770013.
@article{49b06d574b2c40cdaadfe0676f72329e,
title = "Direct confirmation of the high coherency of the electron beam from a nanotip",
abstract = "The coherency of an electron beam from a nanotip was evaluated and compared to that from a tungsten (110) oriented tip by using nano-biprisms in a field-emission projection microscope (FPM). The FPM images were consistent with the corresponding field emission patterns of the employed tip. The nanotip generated much sharper biprism interference patterns than the W(110) tip, and comparison of the visibilities of interference patterns demonstrated directly that a highly coherent electron beam was emitted from the nanotip.",
author = "Tsuyoshi Ishikawa and Boklae Cho and Eiji Rokuta and Chuhei Oshima",
year = "2008",
month = "7",
doi = "10.1143/APEX.1.077001",
language = "English",
volume = "1",
pages = "770011--770013",
journal = "Applied Physics Express",
issn = "1882-0778",
publisher = "Japan Society of Applied Physics",
number = "7",

}

TY - JOUR

T1 - Direct confirmation of the high coherency of the electron beam from a nanotip

AU - Ishikawa, Tsuyoshi

AU - Cho, Boklae

AU - Rokuta, Eiji

AU - Oshima, Chuhei

PY - 2008/7

Y1 - 2008/7

N2 - The coherency of an electron beam from a nanotip was evaluated and compared to that from a tungsten (110) oriented tip by using nano-biprisms in a field-emission projection microscope (FPM). The FPM images were consistent with the corresponding field emission patterns of the employed tip. The nanotip generated much sharper biprism interference patterns than the W(110) tip, and comparison of the visibilities of interference patterns demonstrated directly that a highly coherent electron beam was emitted from the nanotip.

AB - The coherency of an electron beam from a nanotip was evaluated and compared to that from a tungsten (110) oriented tip by using nano-biprisms in a field-emission projection microscope (FPM). The FPM images were consistent with the corresponding field emission patterns of the employed tip. The nanotip generated much sharper biprism interference patterns than the W(110) tip, and comparison of the visibilities of interference patterns demonstrated directly that a highly coherent electron beam was emitted from the nanotip.

UR - http://www.scopus.com/inward/record.url?scp=57649083545&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=57649083545&partnerID=8YFLogxK

U2 - 10.1143/APEX.1.077001

DO - 10.1143/APEX.1.077001

M3 - Article

AN - SCOPUS:57649083545

VL - 1

SP - 770011

EP - 770013

JO - Applied Physics Express

JF - Applied Physics Express

SN - 1882-0778

IS - 7

ER -