The coherency of an electron beam from a nanotip was evaluated and compared to that from a tungsten (110) oriented tip by using nano-biprisms in a field-emission projection microscope (FPM). The FPM images were consistent with the corresponding field emission patterns of the employed tip. The nanotip generated much sharper biprism interference patterns than the W(110) tip, and comparison of the visibilities of interference patterns demonstrated directly that a highly coherent electron beam was emitted from the nanotip.
|Number of pages||3|
|Journal||Applied Physics Express|
|Publication status||Published - 2008 Jul|
ASJC Scopus subject areas
- Physics and Astronomy(all)