Direct measurement of residual gas effect on the sensitivity in TAMA300

R. Takahashi, Y. Saito, Mitsuhiro Fukushima, M. Ando, K. Arai, D. Tatsumi, G. Heinzel, S. Kawamura, T. Yamazaki, S. Moriwaki

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The residual-gas effect on the sensitivity in TAMA300 was measured directly. It was found that a Xe-gas pressure of 0.03 Pa induces an increase in the displacement noise of 3X10-18m/√Hz. This noise level was found to be consistent with a calculated optical path fluctuation due to residual gas within a factor of 2.

Original languageEnglish
Pages (from-to)1237-1241
Number of pages5
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume20
Issue number4
DOIs
Publication statusPublished - 2002 Jul
Externally publishedYes

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Surfaces and Interfaces
  • Physics and Astronomy (miscellaneous)

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  • Cite this

    Takahashi, R., Saito, Y., Fukushima, M., Ando, M., Arai, K., Tatsumi, D., Heinzel, G., Kawamura, S., Yamazaki, T., & Moriwaki, S. (2002). Direct measurement of residual gas effect on the sensitivity in TAMA300. Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 20(4), 1237-1241. https://doi.org/10.1116/1.1479360