Direct measurement of residual gas effect on the sensitivity in TAMA300

R. Takahashi*, Y. Saito, Mitsuhiro Fukushima, M. Ando, K. Arai, D. Tatsumi, G. Heinzel, S. Kawamura, T. Yamazaki, S. Moriwaki

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

The residual-gas effect on the sensitivity in TAMA300 was measured directly. It was found that a Xe-gas pressure of 0.03 Pa induces an increase in the displacement noise of 3X10-18m/√Hz. This noise level was found to be consistent with a calculated optical path fluctuation due to residual gas within a factor of 2.

Original languageEnglish
Pages (from-to)1237-1241
Number of pages5
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume20
Issue number4
DOIs
Publication statusPublished - 2002 Jul
Externally publishedYes

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Surfaces and Interfaces
  • Physics and Astronomy (miscellaneous)

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