By the microspectroscopic imaging of optical reflectivity for the La1-x Srx FeO3-δ thin film with indium-tin-oxide electrodes, we observed that the shape of the conducting area between two electrodes is reversibly varied with applied electric voltage pulses and that causes a repeatable change in the electrical resistance between the electrodes. These results can be explained by the oxygen-ion migration with applied electric field, which induces a variation in the distribution of the Fe4+ ions in the thin film.
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|Publication status||Published - 2009 Mar 3|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics