Direct observation of a repeatable change in electronic states with applied electric voltage pulses in the metal-insulator-metal structure

K. Azumi, K. Aoyama, S. Asanuma, Y. Uesu, Takuro Katsufuji

    Research output: Contribution to journalArticle

    3 Citations (Scopus)

    Abstract

    By the microspectroscopic imaging of optical reflectivity for the La1-x Srx FeO3-δ thin film with indium-tin-oxide electrodes, we observed that the shape of the conducting area between two electrodes is reversibly varied with applied electric voltage pulses and that causes a repeatable change in the electrical resistance between the electrodes. These results can be explained by the oxygen-ion migration with applied electric field, which induces a variation in the distribution of the Fe4+ ions in the thin film.

    Original languageEnglish
    Article number121101
    JournalPhysical Review B - Condensed Matter and Materials Physics
    Volume79
    Issue number12
    DOIs
    Publication statusPublished - 2009 Mar 3

    Fingerprint

    Electronic states
    Metals
    insulators
    Electrodes
    electrodes
    Electric potential
    electric potential
    pulses
    electronics
    metals
    Ions
    Thin films
    Acoustic impedance
    thin films
    oxygen ions
    electrical resistance
    Tin oxides
    indium oxides
    Indium
    tin oxides

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Electronic, Optical and Magnetic Materials

    Cite this

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    abstract = "By the microspectroscopic imaging of optical reflectivity for the La1-x Srx FeO3-δ thin film with indium-tin-oxide electrodes, we observed that the shape of the conducting area between two electrodes is reversibly varied with applied electric voltage pulses and that causes a repeatable change in the electrical resistance between the electrodes. These results can be explained by the oxygen-ion migration with applied electric field, which induces a variation in the distribution of the Fe4+ ions in the thin film.",
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    AU - Azumi, K.

    AU - Aoyama, K.

    AU - Asanuma, S.

    AU - Uesu, Y.

    AU - Katsufuji, Takuro

    PY - 2009/3/3

    Y1 - 2009/3/3

    N2 - By the microspectroscopic imaging of optical reflectivity for the La1-x Srx FeO3-δ thin film with indium-tin-oxide electrodes, we observed that the shape of the conducting area between two electrodes is reversibly varied with applied electric voltage pulses and that causes a repeatable change in the electrical resistance between the electrodes. These results can be explained by the oxygen-ion migration with applied electric field, which induces a variation in the distribution of the Fe4+ ions in the thin film.

    AB - By the microspectroscopic imaging of optical reflectivity for the La1-x Srx FeO3-δ thin film with indium-tin-oxide electrodes, we observed that the shape of the conducting area between two electrodes is reversibly varied with applied electric voltage pulses and that causes a repeatable change in the electrical resistance between the electrodes. These results can be explained by the oxygen-ion migration with applied electric field, which induces a variation in the distribution of the Fe4+ ions in the thin film.

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