マイクロギャップ電極デバイスを用いたシリカ/エポキシ界面の破壊経路の直接観察

Translated title of the contribution: Direct observation of dielectric breakdown path at silica/epoxy interface with a micro-gap electrode device

Rina Sankawa*, Takuya Onishi, Kohei Takahashi, Motohiro Tomita, Kotaro Mura, Takahiro Nakamura, Tetsuo Yoshimitsu, Takahiro Imai, Takanobu Watanabe

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Engineering & Materials Science