Direct observation of the band gap shrinkage in amorphous In 2O3-ZnO thin films

Junjun Jia, Nobuto Oka, Yuzo Shigesato

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

We investigated the dependence of valence- and core-level photoemission spectra of amorphous In2O3-ZnO (a-IZO) films on carrier density by using hard x-ray photoemission spectroscopy (h ν 8000 eV). The valence band edge distinctly shifts toward high binding energy with the increase in carrier density from 0.80 to 3.96 × 10 20 cm - 3, and an abrupt jump for the shift of the valence band edge from high to low binding energy occurs at a carrier density of 4.76 × 10 20 cm - 3. After considering the effect of nonparabolic bandstructure, the shifts are still less than the width of the occupied conduction band, providing direct evidence for the band gap shrinkage. Our calculation results indicate that the contribution of the band gap shrinkage increases as the carrier density increases, which accords with the observations in doped conducting crystal materials, such as Sn doped In2O 3. Moreover, it is found that the conduction electrons of a-IZO films are strongly perturbed by the ionization of core levels, which leads to obvious plasmon satellites in core photoemission spectra lines.

Original languageEnglish
Article number163702
JournalJournal of Applied Physics
Volume113
Issue number16
DOIs
Publication statusPublished - 2013 Apr 28
Externally publishedYes

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shrinkage
photoelectric emission
thin films
valence
shift
binding energy
conduction electrons
line spectra
conduction bands
conduction
ionization
spectroscopy
crystals
x rays

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Direct observation of the band gap shrinkage in amorphous In 2O3-ZnO thin films. / Jia, Junjun; Oka, Nobuto; Shigesato, Yuzo.

In: Journal of Applied Physics, Vol. 113, No. 16, 163702, 28.04.2013.

Research output: Contribution to journalArticle

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