Abstract
Si(111)-5 × 2 Au reconstruction was studied dynamically at 500°C by high-temperature scanning tunneling microscopy (STM). Transitions of the 5 × 2 domains during growth were observed as invasive erosions of one domain by another. Whenever this occurred, the domain with its 2-fold direction crossing the domain boundary eroded away. This phenomenon suggests that growth in the 2-fold direction has a stronger driving force. Comparison with STM images taken at room temperature shows that the gold atoms seem to diffuse in the 2-fold direction at higher temperatures. The driving force is believed to derive from repulsion between the gold atoms.
Original language | English |
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Pages (from-to) | 858-862 |
Number of pages | 5 |
Journal | Surface Science |
Volume | 357-358 |
DOIs | |
Publication status | Published - 1996 Jun 20 |
Externally published | Yes |
Keywords
- Gold
- Growth
- Scanning tunneling microscopy
- Silicon
- Surface structure
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry