Double exposure speckle technique for imaging system analysis and use in rod lens arrays

Shinichi Komatsu, Katsuto Sumi, Hitoshi Ohzu

    Research output: Contribution to journalArticle

    1 Citation (Scopus)

    Abstract

    New double exposure speckle techniques for imaging system analysis are developed and their feasibility is experimentally examined. Using a single convex lens as the test lens, the MTF of the lens is obtained from the measured visibility of Young's fringes which have been produced by Fourier transforming a double exposure specklegram recorded through the test lens. By using conventional optical filtering techniques the spatial variations in the imaging quality are visualized for GRIN rod lens arrays.

    Original languageEnglish
    Pages (from-to)1869-1873
    Number of pages5
    JournalApplied Optics
    Volume28
    Issue number10
    DOIs
    Publication statusPublished - 1989 May 15

    Fingerprint

    systems analysis
    Speckle
    Imaging systems
    Lenses
    rods
    Systems analysis
    lenses
    gradient index optics
    modulation transfer function
    visibility
    Visibility
    Imaging techniques

    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics

    Cite this

    Double exposure speckle technique for imaging system analysis and use in rod lens arrays. / Komatsu, Shinichi; Sumi, Katsuto; Ohzu, Hitoshi.

    In: Applied Optics, Vol. 28, No. 10, 15.05.1989, p. 1869-1873.

    Research output: Contribution to journalArticle

    Komatsu, Shinichi ; Sumi, Katsuto ; Ohzu, Hitoshi. / Double exposure speckle technique for imaging system analysis and use in rod lens arrays. In: Applied Optics. 1989 ; Vol. 28, No. 10. pp. 1869-1873.
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