Dynamically changeable secure scan architecture against scan-based side channel attack

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    25 Citations (Scopus)

    Abstract

    Scan test which is one of the useful design for testability techniques is effective for LSIs including cryptographic circuit. It can observe and control the internal states of the circuit under test by using scan chain. However, scan chain presents a significant security risk of information leakage for scan-based attacks which retrieves secret keys of cryptographic LSIs. In this paper, a secure scan architecture against scan-based attack which still has high testability is proposed. In our method, scan data is dynamically changed by adding the latch to any FFs in the scan chain. We show that by using proposed method, neither the secret key nor the testability of an RSA circuit implementation is compromised, and the effectiveness of the proposed method.

    Original languageEnglish
    Title of host publicationISOCC 2012 - 2012 International SoC Design Conference
    Pages155-158
    Number of pages4
    DOIs
    Publication statusPublished - 2012
    Event2012 International SoC Design Conference, ISOCC 2012 - Jeju Island
    Duration: 2012 Nov 42012 Nov 7

    Other

    Other2012 International SoC Design Conference, ISOCC 2012
    CityJeju Island
    Period12/11/412/11/7

    Fingerprint

    Networks (circuits)
    Design for testability
    Side channel attack

    Keywords

    • RSA
    • scan chain
    • scan-based attack
    • secure scan architecture

    ASJC Scopus subject areas

    • Hardware and Architecture
    • Electrical and Electronic Engineering

    Cite this

    Dynamically changeable secure scan architecture against scan-based side channel attack. / Atobe, Yuta; Shi, Youhua; Yanagisawa, Masao; Togawa, Nozomu.

    ISOCC 2012 - 2012 International SoC Design Conference. 2012. p. 155-158 6407063.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Atobe, Y, Shi, Y, Yanagisawa, M & Togawa, N 2012, Dynamically changeable secure scan architecture against scan-based side channel attack. in ISOCC 2012 - 2012 International SoC Design Conference., 6407063, pp. 155-158, 2012 International SoC Design Conference, ISOCC 2012, Jeju Island, 12/11/4. https://doi.org/10.1109/ISOCC.2012.6407063
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