Edge-enhanced soft X-ray phase-contrast microscopy exploiting the near K-edge optical properties of carbon

Andrew Domondon, Nandor Bokor, Yoshinori Iketaki

Research output: Contribution to journalArticle

Abstract

This paper proposes a method of microscopy we call "edge-enhanced soft X-ray phase-contrast microscopy". It employs a Hilbert-transform microscope setup and exploits the fact that for the same soft X-ray wavelength there is a marked difference in the refractive index for water and carbon. This method produces an edge-enhancement phase contrast image of the molecules that results from the difference in how the X-rays interact with water and the organic molecule of interest. Since this method can detect very small phase jumps, it enables one to observe molecules in vivo with high spatial resolution and high contrast. The results of simulating the technique using the absorption spectrum of tryptophan are presented and suggest that the proposed method will be useful for obtaining images of biological molecules in vivo.

Original languageEnglish
Pages (from-to)521-523
Number of pages3
JournalIEEJ Transactions on Electronics, Information and Systems
Volume134
Issue number4
DOIs
Publication statusPublished - 2014

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Microscopic examination
Optical properties
X rays
Molecules
Carbon
Water
Absorption spectra
Refractive index
Microscopes
Mathematical transformations
Wavelength

Keywords

  • Edge-enhancement
  • Kramers-Kronig relation
  • P anti-bonding orbital
  • Tryptophan
  • X-ray microscopy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Edge-enhanced soft X-ray phase-contrast microscopy exploiting the near K-edge optical properties of carbon. / Domondon, Andrew; Bokor, Nandor; Iketaki, Yoshinori.

In: IEEJ Transactions on Electronics, Information and Systems, Vol. 134, No. 4, 2014, p. 521-523.

Research output: Contribution to journalArticle

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