Effect of Polar Groups on the Electrical Breakdown Strength of Plasma-polymerized Films

Toshiki Nakano; Masao Fukuyama; Hisaaki Hayashi; Keisuke Ishii; Yoshimichi Ohki

doi:10.1109/14.64493

Effect of Polar Groups on the Electrical Breakdown Strength of Plasma-polymerized Films

Toshiki Nakano, Masao Fukuyama, Hisaaki Hayashi, Keisuke Ishii, Yoshimichi Ohki

Kagami Memorial Research Institute for Materials Science and Technology

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Electrical breakdown of plasma polymer films was studied by applying rectangular voltage pulses. The breakdown field increases after incorporation of fluorine atoms into the film when the pulse width is < 5 μs. This is due to the scattering of electronic carriers caused by C—F bonds.

Original language	English
Pages (from-to)	1085-1091
Number of pages	7
Journal	IEEE Transactions on Electrical Insulation
Volume	25
Issue number	6
DOIs	https://doi.org/10.1109/14.64493
Publication status	Published - 1990 Dec

ASJC Scopus subject areas

Engineering(all)
Electrical and Electronic Engineering

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10.1109/14.64493

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@article{c9957212a8c44d82b6629cd12487af4f,

title = "Effect of Polar Groups on the Electrical Breakdown Strength of Plasma-polymerized Films",

abstract = "Electrical breakdown of plasma polymer films was studied by applying rectangular voltage pulses. The breakdown field increases after incorporation of fluorine atoms into the film when the pulse width is < 5 μs. This is due to the scattering of electronic carriers caused by C—F bonds.",

author = "Toshiki Nakano and Masao Fukuyama and Hisaaki Hayashi and Keisuke Ishii and Yoshimichi Ohki",

year = "1990",

month = dec,

doi = "10.1109/14.64493",

language = "English",

volume = "25",

pages = "1085--1091",

journal = "IEEE Transactions on Dielectrics and Electrical Insulation",

issn = "1070-9878",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "6",

}

TY - JOUR

T1 - Effect of Polar Groups on the Electrical Breakdown Strength of Plasma-polymerized Films

AU - Nakano, Toshiki

AU - Fukuyama, Masao

AU - Hayashi, Hisaaki

AU - Ishii, Keisuke

AU - Ohki, Yoshimichi

PY - 1990/12

Y1 - 1990/12

N2 - Electrical breakdown of plasma polymer films was studied by applying rectangular voltage pulses. The breakdown field increases after incorporation of fluorine atoms into the film when the pulse width is < 5 μs. This is due to the scattering of electronic carriers caused by C—F bonds.

AB - Electrical breakdown of plasma polymer films was studied by applying rectangular voltage pulses. The breakdown field increases after incorporation of fluorine atoms into the film when the pulse width is < 5 μs. This is due to the scattering of electronic carriers caused by C—F bonds.

UR - http://www.scopus.com/inward/record.url?scp=0025692261&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0025692261&partnerID=8YFLogxK

U2 - 10.1109/14.64493

DO - 10.1109/14.64493

M3 - Article

AN - SCOPUS:0025692261

VL - 25

SP - 1085

EP - 1091

JO - IEEE Transactions on Dielectrics and Electrical Insulation

JF - IEEE Transactions on Dielectrics and Electrical Insulation

SN - 1070-9878

IS - 6

ER -

Effect of Polar Groups on the Electrical Breakdown Strength of Plasma-polymerized Films

Abstract

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