Effect of surface morphology of a SiO2/Si reference electrode modified by ODMS on the responses to pH and ionic strength

Jinping Wang, Junji Sasano, Tetsuya Osaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The purpose of this work was to study the effect of surface morphology on the responses to pH and ionic strength of a SiO2/Si reference electrode (RE) modified by octadecyltrimethoxysilane (ODMS). Representative REs with contact angles (CA) of 60°, 80° and 106° were studied in various solutions: those with combined effects of pH and ionic strength, those with ionic strength variation and constant pH, and those with pH variation and constant ionic strength. REs with the flat surface show response to ionic strength, while REs with the rough surface show response to pH. The reason may be that total ionic strength determines the charge and potential distribution in the electrolyte-insulator-semiconductor structure for REs with flat surfaces, but that the combined effects of uncovered binding sites, penetration of H + into pinholes, and the special adsorption of H+ dictate the charge and potential distribution for REs with rough surfaces.

Original languageEnglish
Title of host publicationECS Transactions
Pages507-515
Number of pages9
Volume16
Edition11
DOIs
Publication statusPublished - 2008
EventChemical Sensors 8: Chemical (Gas, Ion, Bio) Sensors and Analytical Systems - 214th ECS Meeting - Honolulu, HI
Duration: 2008 Oct 122008 Oct 17

Other

OtherChemical Sensors 8: Chemical (Gas, Ion, Bio) Sensors and Analytical Systems - 214th ECS Meeting
CityHonolulu, HI
Period08/10/1208/10/17

Fingerprint

Ionic strength
Surface morphology
Electrodes
Binding sites
Contact angle
Electrolytes
Semiconductor materials
Adsorption

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Effect of surface morphology of a SiO2/Si reference electrode modified by ODMS on the responses to pH and ionic strength. / Wang, Jinping; Sasano, Junji; Osaka, Tetsuya.

ECS Transactions. Vol. 16 11. ed. 2008. p. 507-515.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Wang, J, Sasano, J & Osaka, T 2008, Effect of surface morphology of a SiO2/Si reference electrode modified by ODMS on the responses to pH and ionic strength. in ECS Transactions. 11 edn, vol. 16, pp. 507-515, Chemical Sensors 8: Chemical (Gas, Ion, Bio) Sensors and Analytical Systems - 214th ECS Meeting, Honolulu, HI, 08/10/12. https://doi.org/10.1149/1.2981157
@inproceedings{68746a7d38004e5aa74191cd70a6f263,
title = "Effect of surface morphology of a SiO2/Si reference electrode modified by ODMS on the responses to pH and ionic strength",
abstract = "The purpose of this work was to study the effect of surface morphology on the responses to pH and ionic strength of a SiO2/Si reference electrode (RE) modified by octadecyltrimethoxysilane (ODMS). Representative REs with contact angles (CA) of 60°, 80° and 106° were studied in various solutions: those with combined effects of pH and ionic strength, those with ionic strength variation and constant pH, and those with pH variation and constant ionic strength. REs with the flat surface show response to ionic strength, while REs with the rough surface show response to pH. The reason may be that total ionic strength determines the charge and potential distribution in the electrolyte-insulator-semiconductor structure for REs with flat surfaces, but that the combined effects of uncovered binding sites, penetration of H + into pinholes, and the special adsorption of H+ dictate the charge and potential distribution for REs with rough surfaces.",
author = "Jinping Wang and Junji Sasano and Tetsuya Osaka",
year = "2008",
doi = "10.1149/1.2981157",
language = "English",
isbn = "9781566776578",
volume = "16",
pages = "507--515",
booktitle = "ECS Transactions",
edition = "11",

}

TY - GEN

T1 - Effect of surface morphology of a SiO2/Si reference electrode modified by ODMS on the responses to pH and ionic strength

AU - Wang, Jinping

AU - Sasano, Junji

AU - Osaka, Tetsuya

PY - 2008

Y1 - 2008

N2 - The purpose of this work was to study the effect of surface morphology on the responses to pH and ionic strength of a SiO2/Si reference electrode (RE) modified by octadecyltrimethoxysilane (ODMS). Representative REs with contact angles (CA) of 60°, 80° and 106° were studied in various solutions: those with combined effects of pH and ionic strength, those with ionic strength variation and constant pH, and those with pH variation and constant ionic strength. REs with the flat surface show response to ionic strength, while REs with the rough surface show response to pH. The reason may be that total ionic strength determines the charge and potential distribution in the electrolyte-insulator-semiconductor structure for REs with flat surfaces, but that the combined effects of uncovered binding sites, penetration of H + into pinholes, and the special adsorption of H+ dictate the charge and potential distribution for REs with rough surfaces.

AB - The purpose of this work was to study the effect of surface morphology on the responses to pH and ionic strength of a SiO2/Si reference electrode (RE) modified by octadecyltrimethoxysilane (ODMS). Representative REs with contact angles (CA) of 60°, 80° and 106° were studied in various solutions: those with combined effects of pH and ionic strength, those with ionic strength variation and constant pH, and those with pH variation and constant ionic strength. REs with the flat surface show response to ionic strength, while REs with the rough surface show response to pH. The reason may be that total ionic strength determines the charge and potential distribution in the electrolyte-insulator-semiconductor structure for REs with flat surfaces, but that the combined effects of uncovered binding sites, penetration of H + into pinholes, and the special adsorption of H+ dictate the charge and potential distribution for REs with rough surfaces.

UR - http://www.scopus.com/inward/record.url?scp=63849125271&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=63849125271&partnerID=8YFLogxK

U2 - 10.1149/1.2981157

DO - 10.1149/1.2981157

M3 - Conference contribution

AN - SCOPUS:63849125271

SN - 9781566776578

VL - 16

SP - 507

EP - 515

BT - ECS Transactions

ER -