Effects of crystallinity and electron mean-free-path on dielectric strength of low density polyethylene

Y. Tanaka, N. Ohnuma, K. Katsunami, Yoshimichi Ohki

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)

    Abstract

    The mean free path of photoinjected hot electrons in LDPE was obtained experimentally, and based on this result the relation between crystallinity and dielectric strength is discussed. The change in X-ray diffraction spectra of 50-μm-thick hot-pressed LDPE films of annealed at various temperatures is shown. The crystallinity of the film is improved as the annealing temperature increases. The relation between the dielectric strength and the annealing temperature of the hot-pressed film is shown. The dielectric strength decreases as the annealing temperature increases, as shown in measurements at room temperature and -50°C. The heat treatment improves the crystallinity and makes the mean free path longer, resulting in a lower dielectric strength.

    Original languageEnglish
    Title of host publicationConference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
    PublisherPubl by IEEE
    Pages545-550
    Number of pages6
    Publication statusPublished - 1990 Oct
    Event1990 Conference on Electrical Insulation and Dielectric Phenomena - Pocono Manor, PA, USA
    Duration: 1990 Oct 281990 Oct 31

    Other

    Other1990 Conference on Electrical Insulation and Dielectric Phenomena
    CityPocono Manor, PA, USA
    Period90/10/2890/10/31

    Fingerprint

    Low density polyethylenes
    Electrons
    Annealing
    Temperature
    Hot electrons
    Heat treatment
    X ray diffraction

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Industrial and Manufacturing Engineering
    • Building and Construction

    Cite this

    Tanaka, Y., Ohnuma, N., Katsunami, K., & Ohki, Y. (1990). Effects of crystallinity and electron mean-free-path on dielectric strength of low density polyethylene. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report (pp. 545-550). Publ by IEEE.

    Effects of crystallinity and electron mean-free-path on dielectric strength of low density polyethylene. / Tanaka, Y.; Ohnuma, N.; Katsunami, K.; Ohki, Yoshimichi.

    Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. Publ by IEEE, 1990. p. 545-550.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Tanaka, Y, Ohnuma, N, Katsunami, K & Ohki, Y 1990, Effects of crystallinity and electron mean-free-path on dielectric strength of low density polyethylene. in Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. Publ by IEEE, pp. 545-550, 1990 Conference on Electrical Insulation and Dielectric Phenomena, Pocono Manor, PA, USA, 90/10/28.
    Tanaka Y, Ohnuma N, Katsunami K, Ohki Y. Effects of crystallinity and electron mean-free-path on dielectric strength of low density polyethylene. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. Publ by IEEE. 1990. p. 545-550
    Tanaka, Y. ; Ohnuma, N. ; Katsunami, K. ; Ohki, Yoshimichi. / Effects of crystallinity and electron mean-free-path on dielectric strength of low density polyethylene. Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. Publ by IEEE, 1990. pp. 545-550
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