Effects of crystallinity and electron mean-free-path on dielectric strength of low-density polyethylene

Yasuhiro Tanaka, Norihiro Ohnuma, Kunio Katsunami, Yoshimichi Ohki

    Research output: Contribution to journalArticle

    42 Citations (Scopus)

    Abstract

    The relation between crystallinity and the mean free path of high-energy electrons in low-density polyethylene (LDPE) and their effects on dielectric strength were studied. Thin LDPE films obtained by vacuum evaporation were annealed at temperatures between room temperature and 100°C. Crystallinity was measured by X-ray diffraction. Electrons were injected into the film by photoemission, and the energy of electrons emitted into vacuum through the film was analyzed to obtain their energy distribution. The mean free path was then calculated from the energy distribution. It was found that the crystallinity increases and the mean free path becomes longer as the annealing temperature increases. Dielectric strength was measured by applying an impulse voltage of 1.2/50 μs at room temperature and -50°C. It was found that the breakdown field decreases with an increase in annealing temperature at both measurement temperatures. Thus, increased crystallinity makes electron transport easier and the mean-free-path longer, resulting in a lower dielectric strength.

    Original languageEnglish
    Pages (from-to)258-265
    Number of pages8
    JournalIEEE Transactions on Electrical Insulation
    Volume26
    Issue number2
    DOIs
    Publication statusPublished - 1991 Apr

    Fingerprint

    Low density polyethylenes
    Electrons
    Temperature
    Annealing
    Vacuum evaporation
    Photoemission
    Temperature measurement
    Vacuum
    X ray diffraction
    Electric potential

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Effects of crystallinity and electron mean-free-path on dielectric strength of low-density polyethylene. / Tanaka, Yasuhiro; Ohnuma, Norihiro; Katsunami, Kunio; Ohki, Yoshimichi.

    In: IEEE Transactions on Electrical Insulation, Vol. 26, No. 2, 04.1991, p. 258-265.

    Research output: Contribution to journalArticle

    @article{80c5ee2778e544d6bc324ad8b1c3730c,
    title = "Effects of crystallinity and electron mean-free-path on dielectric strength of low-density polyethylene",
    abstract = "The relation between crystallinity and the mean free path of high-energy electrons in low-density polyethylene (LDPE) and their effects on dielectric strength were studied. Thin LDPE films obtained by vacuum evaporation were annealed at temperatures between room temperature and 100°C. Crystallinity was measured by X-ray diffraction. Electrons were injected into the film by photoemission, and the energy of electrons emitted into vacuum through the film was analyzed to obtain their energy distribution. The mean free path was then calculated from the energy distribution. It was found that the crystallinity increases and the mean free path becomes longer as the annealing temperature increases. Dielectric strength was measured by applying an impulse voltage of 1.2/50 μs at room temperature and -50°C. It was found that the breakdown field decreases with an increase in annealing temperature at both measurement temperatures. Thus, increased crystallinity makes electron transport easier and the mean-free-path longer, resulting in a lower dielectric strength.",
    author = "Yasuhiro Tanaka and Norihiro Ohnuma and Kunio Katsunami and Yoshimichi Ohki",
    year = "1991",
    month = "4",
    doi = "10.1109/14.78326",
    language = "English",
    volume = "26",
    pages = "258--265",
    journal = "IEEE Transactions on Dielectrics and Electrical Insulation",
    issn = "1070-9878",
    publisher = "Institute of Electrical and Electronics Engineers Inc.",
    number = "2",

    }

    TY - JOUR

    T1 - Effects of crystallinity and electron mean-free-path on dielectric strength of low-density polyethylene

    AU - Tanaka, Yasuhiro

    AU - Ohnuma, Norihiro

    AU - Katsunami, Kunio

    AU - Ohki, Yoshimichi

    PY - 1991/4

    Y1 - 1991/4

    N2 - The relation between crystallinity and the mean free path of high-energy electrons in low-density polyethylene (LDPE) and their effects on dielectric strength were studied. Thin LDPE films obtained by vacuum evaporation were annealed at temperatures between room temperature and 100°C. Crystallinity was measured by X-ray diffraction. Electrons were injected into the film by photoemission, and the energy of electrons emitted into vacuum through the film was analyzed to obtain their energy distribution. The mean free path was then calculated from the energy distribution. It was found that the crystallinity increases and the mean free path becomes longer as the annealing temperature increases. Dielectric strength was measured by applying an impulse voltage of 1.2/50 μs at room temperature and -50°C. It was found that the breakdown field decreases with an increase in annealing temperature at both measurement temperatures. Thus, increased crystallinity makes electron transport easier and the mean-free-path longer, resulting in a lower dielectric strength.

    AB - The relation between crystallinity and the mean free path of high-energy electrons in low-density polyethylene (LDPE) and their effects on dielectric strength were studied. Thin LDPE films obtained by vacuum evaporation were annealed at temperatures between room temperature and 100°C. Crystallinity was measured by X-ray diffraction. Electrons were injected into the film by photoemission, and the energy of electrons emitted into vacuum through the film was analyzed to obtain their energy distribution. The mean free path was then calculated from the energy distribution. It was found that the crystallinity increases and the mean free path becomes longer as the annealing temperature increases. Dielectric strength was measured by applying an impulse voltage of 1.2/50 μs at room temperature and -50°C. It was found that the breakdown field decreases with an increase in annealing temperature at both measurement temperatures. Thus, increased crystallinity makes electron transport easier and the mean-free-path longer, resulting in a lower dielectric strength.

    UR - http://www.scopus.com/inward/record.url?scp=0026139575&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=0026139575&partnerID=8YFLogxK

    U2 - 10.1109/14.78326

    DO - 10.1109/14.78326

    M3 - Article

    VL - 26

    SP - 258

    EP - 265

    JO - IEEE Transactions on Dielectrics and Electrical Insulation

    JF - IEEE Transactions on Dielectrics and Electrical Insulation

    SN - 1070-9878

    IS - 2

    ER -