Effects of Heat and Radiation Aging and Burning on the Surface Physical Properties of Polymer-Insulated Cables

Seitaro Ito, Naoshi Hirai, Takefumi Minakawa, Chiaki Kuroda, Yoshimichi Ohki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

To examine the flame retardancy of polymer-insulated cables used in nuclear power plants, three types of safety-related cables insulated with SiR, FR-XLPE, and FR-EPDM were aged concurrently by heat and radiation. Furthermore, the cables were burned according to the procedures prescribed by two IEEE standards 383-1974 and 1202-2006. The changes appearing in the chemical structure and surface mechanical property were analyzed by measuring FT-MIR spectra and indenter modulus. As a result, it was confirmed that all the cables satisfy with the requirements of two IEEE Stds. Moreover, two IEEE Stds. give similar results as far as indenter modulus is concerned.

Original languageEnglish
Title of host publication2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages374-377
Number of pages4
Volume2018-October
ISBN (Electronic)9781538661925
DOIs
Publication statusPublished - 2018 Nov 26
Event2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018 - Cancun, Mexico
Duration: 2018 Oct 212018 Oct 24

Other

Other2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018
CountryMexico
CityCancun
Period18/10/2118/10/24

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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  • Cite this

    Ito, S., Hirai, N., Minakawa, T., Kuroda, C., & Ohki, Y. (2018). Effects of Heat and Radiation Aging and Burning on the Surface Physical Properties of Polymer-Insulated Cables. In 2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018 (Vol. 2018-October, pp. 374-377). [8544768] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CEIDP.2018.8544768