Effects of norms on learning properties of support vector machines

Kazushi Ikeda, Noboru Murata

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Support Vector Machines (SVMs) are known to have a high generalization ability, yet a heavy computational load since margin maximization results in a quadratic programming problem. It is known that this maximization task results in a pth-order programming problem if we employ the Lp norm instead of the L2 norm. In this paper, we theoretically show the effects of p on the learning properties of SVMs by clarifying its geometrical meaning.

Original languageEnglish
Title of host publication2005 IEEE ICASSP '05 - Proc. - Design and Implementation of Signal Proces.Syst.,Indust. Technol. Track,Machine Learning for Signal Proces. Education, Spec. Sessions
PublisherInstitute of Electrical and Electronics Engineers Inc.
PagesV241-V244
ISBN (Print)0780388747, 9780780388741
DOIs
Publication statusPublished - 2005 Jan 1
Event2005 IEEE International Conference on Acoustics, Speech, and Signal Processing, ICASSP '05 - Philadelphia, PA, United States
Duration: 2005 Mar 182005 Mar 23

Publication series

NameICASSP, IEEE International Conference on Acoustics, Speech and Signal Processing - Proceedings
VolumeV
ISSN (Print)1520-6149

Conference

Conference2005 IEEE International Conference on Acoustics, Speech, and Signal Processing, ICASSP '05
CountryUnited States
CityPhiladelphia, PA
Period05/3/1805/3/23

ASJC Scopus subject areas

  • Software
  • Signal Processing
  • Electrical and Electronic Engineering

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    Ikeda, K., & Murata, N. (2005). Effects of norms on learning properties of support vector machines. In 2005 IEEE ICASSP '05 - Proc. - Design and Implementation of Signal Proces.Syst.,Indust. Technol. Track,Machine Learning for Signal Proces. Education, Spec. Sessions (pp. V241-V244). [1416285] (ICASSP, IEEE International Conference on Acoustics, Speech and Signal Processing - Proceedings; Vol. V). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICASSP.2005.1416285