Efficient keypoint detection and description via polynomial regression of scale space

Ryo Okutani, Kenjiro Sugimoto, Seiichiro Kamata

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Keypoint detection and description using approximate continuous scale space are more efficient techniques than typical discretized scale space for achieving more robust feature matching. However, this state-of-the-art method requires high computational complexity to approximately reconstruct, or decompress, the value at an arbitrary point in scale space. Specifically, it has O(M2) computational complexity where M is an approximation order. This paper presents an efficient scale space approach that provides decompression operation with O(M) complexity without a loss of accuracy. As a result of the fact that the proposed method has much fewer variables to be solved, the least-square solution can be obtained through normal equation. This is easier to solve than the existing method which employs Karhunen-Loeve expansion and generalized eigenvalue problem. Experiments revealed that the proposed method performs as expected from the theoretical analysis.

Original languageEnglish
Title of host publication2016 IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1357-1361
Number of pages5
Volume2016-May
ISBN (Electronic)9781479999880
DOIs
Publication statusPublished - 2016 May 18
Event41st IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2016 - Shanghai, China
Duration: 2016 Mar 202016 Mar 25

Other

Other41st IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2016
Country/TerritoryChina
CityShanghai
Period16/3/2016/3/25

Keywords

  • Compressed scale space
  • Feature extraction
  • Image filtering
  • Scale space
  • Spectral SIFT

ASJC Scopus subject areas

  • Signal Processing
  • Software
  • Electrical and Electronic Engineering

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