Electrochemically crosslinked surface-grafted PVK polymer brushes as a hole transport layer for organic photovoltaics

Maria Celeste Tria, Kang Shyang Liao, Nigel Alley, Seamus Curran, Rigoberto Advincula

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

Electrochemically crosslinked surface-grafted poly(N-vinylcarbazole) (PVK) brushes as hole transport layers (HTLs) on a photovoltaic device have been demonstrated using SI-RAFT polymerization. Comparable performance to PEDOT:PSS/P3HT:PCBM based devices was achieved. A main advantage is strong adhesion to ITO with a possible long-term stability against acid dopants and oxygen.

Original languageEnglish
Pages (from-to)10261-10264
Number of pages4
JournalJournal of Materials Chemistry
Volume21
Issue number28
DOIs
Publication statusPublished - 2011 Jul 28
Externally publishedYes

Fingerprint

Brushes
Polymers
Adhesion
Polymerization
Doping (additives)
Oxygen
Acids
poly-N-vinylcarbazole
poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate)

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Chemistry

Cite this

Electrochemically crosslinked surface-grafted PVK polymer brushes as a hole transport layer for organic photovoltaics. / Tria, Maria Celeste; Liao, Kang Shyang; Alley, Nigel; Curran, Seamus; Advincula, Rigoberto.

In: Journal of Materials Chemistry, Vol. 21, No. 28, 28.07.2011, p. 10261-10264.

Research output: Contribution to journalArticle

Tria, Maria Celeste ; Liao, Kang Shyang ; Alley, Nigel ; Curran, Seamus ; Advincula, Rigoberto. / Electrochemically crosslinked surface-grafted PVK polymer brushes as a hole transport layer for organic photovoltaics. In: Journal of Materials Chemistry. 2011 ; Vol. 21, No. 28. pp. 10261-10264.
@article{608b389eb1ab4b39804fee2f11b488a5,
title = "Electrochemically crosslinked surface-grafted PVK polymer brushes as a hole transport layer for organic photovoltaics",
abstract = "Electrochemically crosslinked surface-grafted poly(N-vinylcarbazole) (PVK) brushes as hole transport layers (HTLs) on a photovoltaic device have been demonstrated using SI-RAFT polymerization. Comparable performance to PEDOT:PSS/P3HT:PCBM based devices was achieved. A main advantage is strong adhesion to ITO with a possible long-term stability against acid dopants and oxygen.",
author = "Tria, {Maria Celeste} and Liao, {Kang Shyang} and Nigel Alley and Seamus Curran and Rigoberto Advincula",
year = "2011",
month = "7",
day = "28",
doi = "10.1039/c1jm11068c",
language = "English",
volume = "21",
pages = "10261--10264",
journal = "Journal of Materials Chemistry",
issn = "0959-9428",
publisher = "Royal Society of Chemistry",
number = "28",

}

TY - JOUR

T1 - Electrochemically crosslinked surface-grafted PVK polymer brushes as a hole transport layer for organic photovoltaics

AU - Tria, Maria Celeste

AU - Liao, Kang Shyang

AU - Alley, Nigel

AU - Curran, Seamus

AU - Advincula, Rigoberto

PY - 2011/7/28

Y1 - 2011/7/28

N2 - Electrochemically crosslinked surface-grafted poly(N-vinylcarbazole) (PVK) brushes as hole transport layers (HTLs) on a photovoltaic device have been demonstrated using SI-RAFT polymerization. Comparable performance to PEDOT:PSS/P3HT:PCBM based devices was achieved. A main advantage is strong adhesion to ITO with a possible long-term stability against acid dopants and oxygen.

AB - Electrochemically crosslinked surface-grafted poly(N-vinylcarbazole) (PVK) brushes as hole transport layers (HTLs) on a photovoltaic device have been demonstrated using SI-RAFT polymerization. Comparable performance to PEDOT:PSS/P3HT:PCBM based devices was achieved. A main advantage is strong adhesion to ITO with a possible long-term stability against acid dopants and oxygen.

UR - http://www.scopus.com/inward/record.url?scp=79960185015&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79960185015&partnerID=8YFLogxK

U2 - 10.1039/c1jm11068c

DO - 10.1039/c1jm11068c

M3 - Article

VL - 21

SP - 10261

EP - 10264

JO - Journal of Materials Chemistry

JF - Journal of Materials Chemistry

SN - 0959-9428

IS - 28

ER -