Electromechanical coupling coefficient of semiconducting hexagonal crystal measured by Brillouin scattering

Takahiko Yanagitani, Taisuke Yoshida, Mami Matsukawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

Super high frequency (SHF) acoustic measurement realizes the piezoelectric characterization in semiconducting material without the effect of electrical conducting. We have proposed the method for measuring shear and extensional electromechanical coupling coefficient k15 and k33 in a semiconducting crystal simultaneously, using Brillouin scattering method. In ZnO crystal, k15 value measured from measured acoustic velocities was in good accordance with the previously reported constant. We also have found large variety in effective piezoelectricity, implying variety of resistivity in the ZnO crystal.

Original languageEnglish
Title of host publicationProceedings - IEEE Ultrasonics Symposium
Pages1487-1490
Number of pages4
DOIs
Publication statusPublished - 2008
Externally publishedYes
Event2008 IEEE International Ultrasonics Symposium, IUS 2008 - Beijing, China
Duration: 2008 Nov 22008 Nov 5

Other

Other2008 IEEE International Ultrasonics Symposium, IUS 2008
CountryChina
CityBeijing
Period08/11/208/11/5

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Keywords

  • Brillouin scattering
  • Component
  • Electromechanical coupling coefficient
  • Piezoelectric semiconductor
  • ZnO

ASJC Scopus subject areas

  • Acoustics and Ultrasonics

Cite this

Yanagitani, T., Yoshida, T., & Matsukawa, M. (2008). Electromechanical coupling coefficient of semiconducting hexagonal crystal measured by Brillouin scattering. In Proceedings - IEEE Ultrasonics Symposium (pp. 1487-1490). [4803544] https://doi.org/10.1109/ULTSYM.2008.0362