Electromechanical coupling coefficient of semiconducting hexagonal crystal measured by Brillouin scattering

Takahiko Yanagitani; Taisuke Yoshida; Mami Matsukawa

doi:10.1109/ULTSYM.2008.0362

Electromechanical coupling coefficient of semiconducting hexagonal crystal measured by Brillouin scattering

Takahiko Yanagitani^*, Taisuke Yoshida, Mami Matsukawa

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

10 Citations (Scopus)

Abstract

Super high frequency (SHF) acoustic measurement realizes the piezoelectric characterization in semiconducting material without the effect of electrical conducting. We have proposed the method for measuring shear and extensional electromechanical coupling coefficient k₁₅ and k₃₃ in a semiconducting crystal simultaneously, using Brillouin scattering method. In ZnO crystal, k₁₅ value measured from measured acoustic velocities was in good accordance with the previously reported constant. We also have found large variety in effective piezoelectricity, implying variety of resistivity in the ZnO crystal.

Original language	English
Article number	4803544
Pages (from-to)	1487-1490
Number of pages	4
Journal	Proceedings - IEEE Ultrasonics Symposium
DOIs	https://doi.org/10.1109/ULTSYM.2008.0362
Publication status	Published - 2008 Dec 1
Externally published	Yes
Event	2008 IEEE International Ultrasonics Symposium, IUS 2008 - Beijing, China Duration: 2008 Nov 2 → 2008 Nov 5

Keywords

Brillouin scattering
Component
Electromechanical coupling coefficient
Piezoelectric semiconductor
ZnO

ASJC Scopus subject areas

Acoustics and Ultrasonics

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10.1109/ULTSYM.2008.0362

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title = "Electromechanical coupling coefficient of semiconducting hexagonal crystal measured by Brillouin scattering",

abstract = "Super high frequency (SHF) acoustic measurement realizes the piezoelectric characterization in semiconducting material without the effect of electrical conducting. We have proposed the method for measuring shear and extensional electromechanical coupling coefficient k15 and k33 in a semiconducting crystal simultaneously, using Brillouin scattering method. In ZnO crystal, k15 value measured from measured acoustic velocities was in good accordance with the previously reported constant. We also have found large variety in effective piezoelectricity, implying variety of resistivity in the ZnO crystal.",

keywords = "Brillouin scattering, Component, Electromechanical coupling coefficient, Piezoelectric semiconductor, ZnO",

author = "Takahiko Yanagitani and Taisuke Yoshida and Mami Matsukawa",

year = "2008",

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day = "1",

doi = "10.1109/ULTSYM.2008.0362",

language = "English",

pages = "1487--1490",

journal = "Proceedings of the IEEE Ultrasonics Symposium",

issn = "1051-0117",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2008 IEEE International Ultrasonics Symposium, IUS 2008 ; Conference date: 02-11-2008 Through 05-11-2008",

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TY - JOUR

T1 - Electromechanical coupling coefficient of semiconducting hexagonal crystal measured by Brillouin scattering

AU - Yanagitani, Takahiko

AU - Yoshida, Taisuke

AU - Matsukawa, Mami

PY - 2008/12/1

Y1 - 2008/12/1

N2 - Super high frequency (SHF) acoustic measurement realizes the piezoelectric characterization in semiconducting material without the effect of electrical conducting. We have proposed the method for measuring shear and extensional electromechanical coupling coefficient k15 and k33 in a semiconducting crystal simultaneously, using Brillouin scattering method. In ZnO crystal, k15 value measured from measured acoustic velocities was in good accordance with the previously reported constant. We also have found large variety in effective piezoelectricity, implying variety of resistivity in the ZnO crystal.

AB - Super high frequency (SHF) acoustic measurement realizes the piezoelectric characterization in semiconducting material without the effect of electrical conducting. We have proposed the method for measuring shear and extensional electromechanical coupling coefficient k15 and k33 in a semiconducting crystal simultaneously, using Brillouin scattering method. In ZnO crystal, k15 value measured from measured acoustic velocities was in good accordance with the previously reported constant. We also have found large variety in effective piezoelectricity, implying variety of resistivity in the ZnO crystal.

KW - Brillouin scattering

KW - Component

KW - Electromechanical coupling coefficient

KW - Piezoelectric semiconductor

KW - ZnO

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U2 - 10.1109/ULTSYM.2008.0362

DO - 10.1109/ULTSYM.2008.0362

M3 - Conference article

AN - SCOPUS:67649386918

SN - 1051-0117

SP - 1487

EP - 1490

JO - Proceedings of the IEEE Ultrasonics Symposium

JF - Proceedings of the IEEE Ultrasonics Symposium

M1 - 4803544

T2 - 2008 IEEE International Ultrasonics Symposium, IUS 2008

Y2 - 2 November 2008 through 5 November 2008

ER -

Electromechanical coupling coefficient of semiconducting hexagonal crystal measured by Brillouin scattering

Abstract

Keywords

ASJC Scopus subject areas

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