Electron-phonon scattering effect on strained si nanowire FETs at low temperature

I. Tsuchida*, A. Seike, H. Takai, J. Masuda, D. Kosemura, A. Ogura, T. Watanabe, I. Ohdomari

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'Electron-phonon scattering effect on strained si nanowire FETs at low temperature'. Together they form a unique fingerprint.

Engineering & Materials Science