ELECTRON-SPECTROSCOPY STUDY ON THE CAUSE OF HIGHER BREAKDOWN STRENGTH IN ETHYLENE-STYRENE COPOLYMER.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    It is known that electrons with energies near the ionization potential (referred to here as high-energy electrons) play an important role in triggering the damage process in polymeric insulators. An investigation is reported in which the interfacial photoemission technique was used to test for the existence of a mean free path on the order of 10-n mu m to prove the existence of high-mobility electrons in the breakdown field. This method is similar to the photoemission into vacuum, except that the hot electrons are injected from the metal directly into the conduction band of the insulator. To measure the energy distribution of the photoexcited electrons passing through the dielectric, the retarding-potential method was chosen. The kinetic energy distribution of the photoelectrons is obtained by varying the retarding voltage applied to the emitter and taking the derivative of the generated current-voltage characteristic. The negative derivative(-dI/dV//R) gives the number of photoelectrons per unit energy, i. e. , the energy distribution curve (EDC). The results of the present study help to clarify the cause of the increase in the breakdown strength of the copolymer by giving direct experimental evidence of the energy absorption property of the benzene-ring structure.

    Original languageEnglish
    Title of host publicationConference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
    PublisherIEEE
    Pages525-530
    Number of pages6
    Publication statusPublished - 1987
    EventAnnu Rep Conf Electr Insul Dielectr Phenom 1987 - Gaitherburg, MD, USA
    Duration: 1987 Oct 181987 Oct 22

    Other

    OtherAnnu Rep Conf Electr Insul Dielectr Phenom 1987
    CityGaitherburg, MD, USA
    Period87/10/1887/10/22

    Fingerprint

    Electron spectroscopy
    Styrene
    Ethylene
    Copolymers
    Photoemission
    Photoelectrons
    Electrons
    Derivatives
    Hot electrons
    Ionization potential
    Electron mobility
    Energy absorption
    Current voltage characteristics
    Conduction bands
    Kinetic energy
    Benzene
    Vacuum
    Electric potential
    Metals

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Industrial and Manufacturing Engineering
    • Building and Construction

    Cite this

    Racz, I., & Ohki, Y. (1987). ELECTRON-SPECTROSCOPY STUDY ON THE CAUSE OF HIGHER BREAKDOWN STRENGTH IN ETHYLENE-STYRENE COPOLYMER. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report (pp. 525-530). IEEE.

    ELECTRON-SPECTROSCOPY STUDY ON THE CAUSE OF HIGHER BREAKDOWN STRENGTH IN ETHYLENE-STYRENE COPOLYMER. / Racz, I.; Ohki, Yoshimichi.

    Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. IEEE, 1987. p. 525-530.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Racz, I & Ohki, Y 1987, ELECTRON-SPECTROSCOPY STUDY ON THE CAUSE OF HIGHER BREAKDOWN STRENGTH IN ETHYLENE-STYRENE COPOLYMER. in Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. IEEE, pp. 525-530, Annu Rep Conf Electr Insul Dielectr Phenom 1987, Gaitherburg, MD, USA, 87/10/18.
    Racz I, Ohki Y. ELECTRON-SPECTROSCOPY STUDY ON THE CAUSE OF HIGHER BREAKDOWN STRENGTH IN ETHYLENE-STYRENE COPOLYMER. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. IEEE. 1987. p. 525-530
    Racz, I. ; Ohki, Yoshimichi. / ELECTRON-SPECTROSCOPY STUDY ON THE CAUSE OF HIGHER BREAKDOWN STRENGTH IN ETHYLENE-STYRENE COPOLYMER. Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. IEEE, 1987. pp. 525-530
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    abstract = "It is known that electrons with energies near the ionization potential (referred to here as high-energy electrons) play an important role in triggering the damage process in polymeric insulators. An investigation is reported in which the interfacial photoemission technique was used to test for the existence of a mean free path on the order of 10-n mu m to prove the existence of high-mobility electrons in the breakdown field. This method is similar to the photoemission into vacuum, except that the hot electrons are injected from the metal directly into the conduction band of the insulator. To measure the energy distribution of the photoexcited electrons passing through the dielectric, the retarding-potential method was chosen. The kinetic energy distribution of the photoelectrons is obtained by varying the retarding voltage applied to the emitter and taking the derivative of the generated current-voltage characteristic. The negative derivative(-dI/dV//R) gives the number of photoelectrons per unit energy, i. e. , the energy distribution curve (EDC). The results of the present study help to clarify the cause of the increase in the breakdown strength of the copolymer by giving direct experimental evidence of the energy absorption property of the benzene-ring structure.",
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    N2 - It is known that electrons with energies near the ionization potential (referred to here as high-energy electrons) play an important role in triggering the damage process in polymeric insulators. An investigation is reported in which the interfacial photoemission technique was used to test for the existence of a mean free path on the order of 10-n mu m to prove the existence of high-mobility electrons in the breakdown field. This method is similar to the photoemission into vacuum, except that the hot electrons are injected from the metal directly into the conduction band of the insulator. To measure the energy distribution of the photoexcited electrons passing through the dielectric, the retarding-potential method was chosen. The kinetic energy distribution of the photoelectrons is obtained by varying the retarding voltage applied to the emitter and taking the derivative of the generated current-voltage characteristic. The negative derivative(-dI/dV//R) gives the number of photoelectrons per unit energy, i. e. , the energy distribution curve (EDC). The results of the present study help to clarify the cause of the increase in the breakdown strength of the copolymer by giving direct experimental evidence of the energy absorption property of the benzene-ring structure.

    AB - It is known that electrons with energies near the ionization potential (referred to here as high-energy electrons) play an important role in triggering the damage process in polymeric insulators. An investigation is reported in which the interfacial photoemission technique was used to test for the existence of a mean free path on the order of 10-n mu m to prove the existence of high-mobility electrons in the breakdown field. This method is similar to the photoemission into vacuum, except that the hot electrons are injected from the metal directly into the conduction band of the insulator. To measure the energy distribution of the photoexcited electrons passing through the dielectric, the retarding-potential method was chosen. The kinetic energy distribution of the photoelectrons is obtained by varying the retarding voltage applied to the emitter and taking the derivative of the generated current-voltage characteristic. The negative derivative(-dI/dV//R) gives the number of photoelectrons per unit energy, i. e. , the energy distribution curve (EDC). The results of the present study help to clarify the cause of the increase in the breakdown strength of the copolymer by giving direct experimental evidence of the energy absorption property of the benzene-ring structure.

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