Electron spin resonance study of interface trap states and charge carrier concentration in rubrene single-crystal field-effect transistors

Masaki Tsuji, Norimichi Arai, Kazuhiro Marumoto*, Jun Takeya, Yukihiro Shimoi, Hisaaki Tanaka, Shin Ichi Kuroda, Taishi Takenobu, Yoshihiro Iwasa

*Corresponding author for this work

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